Erratum: ‘‘Characterization of grain boundaries in polycrystalline solar cells using a computerized electron beam induced current system’’ [Rev. Sci. Instrum. 54, 1005 (1983)]

C. Donolato; R. O. Bell

doi:10.1063/1.1137972

Erratum: ‘‘Characterization of grain boundaries in polycrystalline solar cells using a computerized electron beam induced current system’’ [Rev. Sci. Instrum. 54, 1005 (1983)]

Review of Scientific Instruments ◽

10.1063/1.1137972 ◽

1984 ◽

Vol 55 (1) ◽

pp. 133-133 ◽

Cited By ~ 1

Author(s):

C. Donolato ◽

R. O. Bell

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Grain Boundaries ◽

Current System ◽

Induced Current ◽

Electron Beam Induced Current

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Characterization of grain boundaries in polycrystalline solar cells using a computerized electron beam induced current system

Review of Scientific Instruments ◽

10.1063/1.1137517 ◽

1983 ◽

Vol 54 (8) ◽

pp. 1005-1008 ◽

Cited By ~ 12

Author(s):

C. Donolato ◽

R. O. Bell

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Grain Boundaries ◽

Current System ◽

Induced Current ◽

Electron Beam Induced Current

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Characterization of Grain Boundaries by the Electron Beam Induced Current Method

Springer Proceedings in Physics - Polycrystalline Semiconductors II ◽

10.1007/978-3-642-76385-4_9 ◽

1991 ◽

pp. 62-71

Author(s):

L. Pasemann

Keyword(s):

Electron Beam ◽

Grain Boundaries ◽

Current Method ◽

Induced Current ◽

Electron Beam Induced Current

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Electron-beam-induced current characterization of polycrystalline silicon solar cells

Solar Cells ◽

10.1016/0379-6787(80)90040-x ◽

1980 ◽

Vol 1 (2) ◽

pp. 123-139 ◽

Cited By ~ 22

Author(s):

J.I. Hanoka

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Polycrystalline Silicon ◽

Silicon Solar Cells ◽

Induced Current ◽

Electron Beam Induced Current

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Direct Characterization of Axial p-n Junctions for InP Nanowire Array Solar Cells Using Electron Beam-Induced Current

Light, Energy and the Environement 2015 ◽

10.1364/pv.2015.ptu3b.4 ◽

2015 ◽

Author(s):

Qian Gao ◽

Lan Fu ◽

Li Li ◽

Kaushal Vora ◽

Ziyuan Li ◽

...

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Nanowire Array ◽

Induced Current ◽

Electron Beam Induced Current

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Use of electron beam induced current to determine diffusion lengths and radiation damage coefficients in GaAs space solar cells

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/30/4/020 ◽

1997 ◽

Vol 30 (4) ◽

pp. 645-654 ◽

Cited By ~ 1

Author(s):

C Hardingham

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Radiation Damage ◽

Induced Current ◽

Electron Beam Induced Current

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Scanning light spot scan and electron-beam-induced current studies of CdS/CuxS solar cells formed on rough and smooth single-crystal CdS substrates

Solar Cells ◽

10.1016/0379-6787(83)90057-1 ◽

1983 ◽

Vol 10 (3) ◽

pp. 287-294 ◽

Cited By ~ 1

Author(s):

C.H. Cheng ◽

B. Merritt ◽

C.W. Tu ◽

K.A. Jones

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Single Crystal ◽

Light Spot ◽

Induced Current ◽

Electron Beam Induced Current

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Back Cover: Low energy scanning transmission electron beam induced current for nanoscale characterization of p-n junctions (Phys. Status Solidi RRL 1/2017)

physica status solidi (RRL) - Rapid Research Letters ◽

10.1002/pssr.201770303 ◽

2017 ◽

Vol 11 (1) ◽

pp. 1770303

Author(s):

Patrick Peretzki ◽

Benedikt Ifland ◽

Christian Jooss ◽

Michael Seibt

Keyword(s):

Electron Beam ◽

Low Energy ◽

Induced Current ◽

Back Cover ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Nanoscale Characterization ◽

Electron Beam Induced Current

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Defect characterization of Cd0.9Zn0.1Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements

10.1117/12.2196590 ◽

2015 ◽

Cited By ~ 1

Author(s):

Rahmi O. Pak ◽

Khai V. Nguyen ◽

Cihan Oner ◽

Mohammad A. Mannan ◽

Krishna C. Mandal

Keyword(s):

Electron Beam ◽

Defect Characterization ◽

Induced Current ◽

Thermally Stimulated Current ◽

Electron Beam Induced Current

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Direct Characterization of Grain-Boundary Electrical Activity in Doped (Ba0.6Sr0.4)TiO3by Combined Imaging of Electron-Beam-Induced Current and Electron-Backscattered Diffraction

Journal of the American Ceramic Society ◽

10.1111/j.1551-2916.2004.01153.x ◽

2004 ◽

Vol 87 (6) ◽

pp. 1153-1156 ◽

Cited By ~ 4

Author(s):

Katsuro Hayashi ◽

Takahisa Yamamoto ◽

Yuichi Ikuhara ◽

Taketo Sakuma

Keyword(s):

Electron Beam ◽

Grain Boundary ◽

Electrical Activity ◽

Induced Current ◽

Electron Backscattered Diffraction ◽

Electron Beam Induced Current ◽

Combined Imaging

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Temperature dependent electron beam induced current experiments on chalcopyrite thin film solar cells

Applied Physics Letters ◽

10.1063/1.118467 ◽

1997 ◽

Vol 70 (8) ◽

pp. 1011-1013 ◽

Cited By ~ 8

Author(s):

R. Scheer ◽

M. Wilhelm ◽

L. Stolt

Keyword(s):

Thin Film ◽

Electron Beam ◽

Solar Cells ◽

Thin Film Solar Cells ◽

Induced Current ◽

Temperature Dependent ◽

Electron Beam Induced Current

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