scholarly journals Secondary fluorescent excitation in the scanning electron microscope: Improved sensitivity of energy dispersive analysis

1975 ◽  
Vol 46 (10) ◽  
pp. 1427-1428 ◽  
Author(s):  
R. W. Gould ◽  
J. T. Healey
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Energy Dispersive ◽  
Energy Dispersive Analysis ◽  
Dispersive Analysis ◽  
Scanning Electron

scholarly journals Определение толщины поляризованной области стекла

2021 ◽  
Vol 47 (5) ◽  
pp. 16
Author(s):  
А.И. Дергачев ◽  
В.В. Журихина ◽  
А.А. Липовский
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Energy Dispersive ◽  
Energy Dispersive Analysis ◽  
Sem Images ◽  
Dispersive Analysis ◽  
Scanning Electron ◽  
Good Agreement

It is shown that the scattering of electrons near the interface between the poled and unpoled regions of glass makes it possible to determine the thickness of the poled region from the image obtained by a scanning electron microscope. Good agreement between the thicknesses determined from the SEM images and by energy dispersive analysis was demonstrated.

scholarly journals Penyelidikan Karakteristik Lapisan Diamond Film Pahat Karbida Terhadap Pembebanan Mekanik Pada Pembubutan Kering

2017 ◽  
Vol 1 (1) ◽  
pp. 32 ◽  
Author(s):  
Fransnazoan Sitorus ◽  
Armasyah Ginting ◽  
Basuki Wirjosentono
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Diamond Film ◽  
Energy Dispersive ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Dispersive Analysis ◽  
Scanning Electron

Penelitian ini bertujuan untuk mengkarakterisasi lapisan diamond-film yang digunakan sebagai bahan pelapis pahat karbida khususnya bahan pelapis (diamond-film CVD), sehubungan dengan adanya laporan penelitian perihal kegagalan fungsi dari bahan pelapis pahat karbida yang digunakan pada proses pemesinan kering bahan non-ferro metal pada awal proses pemotongan berlangsung (initial wear). Kajian karakteristik lapisan diamond-film pahat dilakukan melalui pendekatan beban mekanik melalui proses pemesinan kering menggunakan bahan paduan aluminium 6061. Kondisi pemotongan yaitu v= 350 m/min; f= 0.15 mm/put; a= 1.5 mm pada fasa Initial-wear (tc= 1.736 min). Uji beban mekanik menggunakan bahan uji berkekerasan berbeda, Aluminium 6061 (53.3 HRB/95 HV) dan AISI 1070 (93.3 HRB/200 HV), hasil pengujian pada bahan uji Aluminium 6061 diperoleh keadaan Aus-abrasive VB= 0.070 mm, dan pada bahan uji AISI 1070 diperoleh keadaan Aus tepi VB= 0.250 mm, analisa menggunakan scanning electron microscope (SEM) dan energy dispersive analysis X-Ray spectroscopy (EDAX), hasil pengujian diperoleh sebaran unsur pelapis diamond-film pada bahan uji Aluminium 6061 terhadap kondisi pemotongan diperoleh keadaan unsur material pelapis diamond film masih signifikan. Kemudian pada bahan uji AISI 1070 terhadap kedua kondisi pemotongan diperoleh keadaan unsur material pelapis diamond-film signifikan. Dari hasil penelitian disimpulkan bahwa pendekatan beban mekanik tidak ditemukan peristiwa pengelupasan lapisan diamond-film pahat karbida, fenomena yang terjadi terhadap ketiga pendekatan yang dilakukan adalah peristiwa hilang bertahapnya sebagian volume material pelapis diamond-film yang melapisi material substrate akibat Aus pengikisan lapisan (abrasive-coating wear).

scholarly journals Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic

2009 ◽  
Vol 15 (S2) ◽  
pp. 218-219
Author(s):  
RE Edelmann ◽  
V Vasudevan ◽  
D Kohls ◽  
J Ullmer
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Element ◽  
Low Energy ◽  
Energy Dispersive ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Dispersive Analysis ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

scholarly journals Characterizing Severely Plastically Deformed Materials Using Transmission Kikuchi Diffraction and Energy Dispersive X-ray Spectroscopy in the Scanning Electron Microscope

2013 ◽  
Vol 19 (S2) ◽  
pp. 692-693
Author(s):  
P. Trimby
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Energy Dispersive ◽  
X Ray ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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