Characterization of interface topography of the buried Si‐SiO2interface in silicon‐on‐insulator material by atomic force microscopy

S. W. Crowder; P. B. Griffin; J. D. Plummer

doi:10.1063/1.112968

Characterization of interface topography of the buried Si‐SiO2interface in silicon‐on‐insulator material by atomic force microscopy

Applied Physics Letters ◽

10.1063/1.112968 ◽

1994 ◽

Vol 65 (13) ◽

pp. 1698-1699 ◽

Cited By ~ 10

Author(s):

S. W. Crowder ◽

P. B. Griffin ◽

J. D. Plummer

Keyword(s):

Atomic Force Microscopy ◽

Silicon On Insulator ◽

Force Microscopy ◽

Atomic Force

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Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

Microscopy Research and Technique ◽

10.1002/jemt.23699 ◽

2021 ◽

Author(s):

Willian Silva Conceição ◽

Ştefan Ţălu ◽

Robert Saraiva Matos ◽

Glenda Quaresma Ramos ◽

Fidel Guereiro Zayas ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Amazon Rainforest ◽

Force Microscopy ◽

Atomic Force ◽

Dinizia Excelsa

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Characterization of two- and one-dimensional water networks on Ni(111) via atomic force microscopy

Physical Review Materials ◽

10.1103/physrevmaterials.3.093001 ◽

2019 ◽

Vol 3 (9) ◽

Cited By ~ 6

Author(s):

Akitoshi Shiotari ◽

Yoshiaki Sugimoto ◽

Hiroshi Kamio

Keyword(s):

Atomic Force Microscopy ◽

Water Networks ◽

One Dimensional ◽

Force Microscopy ◽

Atomic Force

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Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

Thin Solid Films ◽

10.1016/s0040-6090(98)00453-2 ◽

1998 ◽

Vol 321 (1-2) ◽

pp. 86-91 ◽

Cited By ~ 14

Author(s):

G Wöhl ◽

C Schöllhorn ◽

O.G Schmidt ◽

K Brunner ◽

K Eberl ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron ◽

Self Assembled

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Mechanical characterization of cellulose single nanofiber by atomic force microscopy

10.1117/12.2259856 ◽

2017 ◽

Author(s):

Lindong Zhai ◽

Jeong Woong Kim ◽

Jiyun Lee ◽

Jaehwan Kim

Keyword(s):

Atomic Force Microscopy ◽

Mechanical Characterization ◽

Force Microscopy ◽

Atomic Force

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Characterization of Electron Emission from High Density Self-Aligned Si-Based Quantum Dots by Conducting-Probe Atomic Force Microscopy

ECS Transactions ◽

10.1149/06406.0923ecst ◽

2014 ◽

Vol 64 (6) ◽

pp. 923-928 ◽

Cited By ~ 2

Author(s):

D. Takeuchi ◽

K. Makihara ◽

A. Ohta ◽

M. Ikeda ◽

S. Miyazaki

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Electron Emission ◽

High Density ◽

Force Microscopy ◽

Atomic Force

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Characterization of mitochondria isolated from normal and ischemic hearts in rats utilizing atomic force microscopy

Micron ◽

10.1016/j.micron.2010.09.002 ◽

2011 ◽

Vol 42 (3) ◽

pp. 299-304 ◽

Cited By ~ 24

Author(s):

Gi-Ja Lee ◽

Su-Jin Chae ◽

Jae Hoon Jeong ◽

So-Ra Lee ◽

Sang-Jin Ha ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

Journal of Applied Physics ◽

10.1063/1.357474 ◽

1994 ◽

Vol 76 (6) ◽

pp. 3443-3447 ◽

Cited By ~ 12

Author(s):

J. M. Yáñez‐Limón ◽

F. Ruiz ◽

J. González‐Hernández ◽

C. Vázquez‐López ◽

E. López‐Cruz

Keyword(s):

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Carbon Films ◽

Force Microscopy ◽

Atomic Force

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Characterization of Batch-Microfabricated Scanning Electrochemical-Atomic Force Microscopy Probes

Analytical Chemistry ◽

10.1021/ac048930e ◽

2005 ◽

Vol 77 (2) ◽

pp. 424-434 ◽

Cited By ~ 54

Author(s):

Phillip S. Dobson ◽

John M. R. Weaver ◽

Mark N. Holder ◽

Patrick R. Unwin ◽

Julie V. Macpherson

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Atomic force microscopy and nanoindentation characterization of human lamellar bone prepared by microtome sectioning and mechanical polishing technique

Journal of Biomedical Materials Research ◽

10.1002/jbm.a.10109 ◽

2003 ◽

Vol 67A (3) ◽

pp. 719-726 ◽

Cited By ~ 68

Author(s):

J. Xu ◽

J. Y. Rho ◽

S. R. Mishra ◽

Z. Fan

Keyword(s):

Atomic Force Microscopy ◽

Mechanical Polishing ◽

Lamellar Bone ◽

Force Microscopy ◽

Atomic Force

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Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Applied Physics Express ◽

10.1143/apex.5.016602 ◽

2011 ◽

Vol 5 (1) ◽

pp. 016602 ◽

Cited By ~ 8

Author(s):

Lan Zhang ◽

Yang Ju ◽

Atsushi Hosoi ◽

Akifumi Fujimoto

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Quantitative Measurement ◽

Nanometer Scale ◽

Force Microscopy ◽

Atomic Force

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