Study of reactive ion etching‐induced damage in GaAs/AlGaAs structures using a quantum well intermixing probe
Keyword(s):
1998 ◽
Vol 42
(11)
◽
pp. 1933-1937
◽
1988 ◽
Vol 6
(6)
◽
pp. 1906
◽
1996 ◽
Vol 14
(6)
◽
pp. 3654
◽
1996 ◽
Vol 159
(1-4)
◽
pp. 451-454
◽
1998 ◽
Vol 16
(4)
◽
pp. 1818
◽
1997 ◽
Vol 35
(1-4)
◽
pp. 33-36
◽
Keyword(s):
1995 ◽
Vol 13
(2)
◽
pp. 268
◽
1996 ◽
Vol 11
(5)
◽
pp. 801-804
◽
Keyword(s):