Critical current density and microstructure of screen‐printed (Bi,Pb)2Sr2Ca2Cu3Oxthick film sandwiched between Ag substrates

1993 ◽  
Vol 63 (2) ◽  
pp. 243-245 ◽  
Author(s):  
A. Oota ◽  
H. Matsui ◽  
M. Funakura ◽  
J. Iwaya ◽  
J. Maeda
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Screen Printed

Bulk Ceramic and Screen Printed EuBa2Cu3O7-δ

1987 ◽  
Vol 99 ◽  
Author(s):  
W. S. Fu ◽  
D. S. Ginley ◽  
M. A. Mitchell ◽  
E. L. Venturini ◽  
B. Morosin ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Thick Films ◽  
Weak Links ◽  
Bulk Ceramic ◽  
Zero Resistance ◽  
Two Phases ◽  
Screen Printed

ABSTRACTThe structural, magnetic and electrical properties of EuBa2Cu3O7-δ have been investigated both for bulk ceramics and screen printed thick films. The bulk ceramic reaches zero resistance at 92 K, and has large intragranular critical current density inferred from magnetization loops; the directly measured critical current density is substantially lower because of the weak links (Josephson junctions) between grains. Screen printed thick films on strontium titanate have poor magnetic and resistive transitions with evidence for two phases. High temperature oxygen anneals produce a bulk ceramic with significantly enhanced magnetic properties.

scholarly journals Intragranular Critical Current Density of Superconductor Grain in Screen-printed Ag-Bi2223 Tape.

1999 ◽  
Vol 34 (2) ◽  
pp. 73-78 ◽  
Author(s):  
Kenji KAWANO ◽  
Kazuo FUKUTA ◽  
Akio OOTA ◽  
Takamitsu HIGUTI ◽  
Hiroyuki FUJIMOTO
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Bi2223 Tape ◽  
Screen Printed

Intragranular critical current density of superconductor grain in screen-printed Ag-Bi2223 tape

Cryogenics ◽  
1999 ◽  
Vol 39 (10) ◽  
pp. 853-858 ◽  
Author(s):  
Kenji Kawano ◽  
Akio Oota ◽  
Kazuo Fukuta ◽  
Takamitsu Higuchi ◽  
Hiroyuki Fujimoto
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Bi2223 Tape ◽  
Screen Printed

Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

1991 ◽  
Vol 49 ◽  
pp. 1080-1081
Author(s):  
P. Lu ◽  
W. Huang ◽  
C.S. Chern ◽  
Y.Q. Li ◽  
J. Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Film Growth ◽  
Chemical Vapor ◽  
Microstructural Characterization ◽  
Ion Milling ◽  
Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

1996 ◽  
Vol 54 ◽  
pp. 338-339
Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Electromagnetic Properties ◽  
Length Scale ◽  
Density Values ◽  
Current Densities ◽  
Applied Fields ◽  
A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

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