Characterization of SiO2/Si(100) interface structure of ultrathin SiO2films using spatially resolved electron energy loss spectroscopy

1992 ◽  
Vol 61 (6) ◽  
pp. 693-695 ◽  
Author(s):  
Hisashi Fukuda ◽  
Makoto Yasuda ◽  
Toshiyuki Iwabuchi
2014 ◽  
Vol 20 (S3) ◽  
pp. 432-433 ◽  
Author(s):  
Samartha A. Channagiri ◽  
G. B Viswanathan ◽  
Robert Nichol ◽  
Shrikant C. Nagpure ◽  
David W. McComb

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