Spatial coherence of a repetitive laser‐plasma point x‐ray source in the water window spectral region

1992 ◽  
Vol 60 (10) ◽  
pp. 1155-1157 ◽  
Author(s):  
H. Daido ◽  
I. C. E. Turcu ◽  
I. N. Ross ◽  
J. G. Watson ◽  
M. Steyer ◽  
...  
1993 ◽  
Vol 73 (12) ◽  
pp. 8081-8087 ◽  
Author(s):  
I. C. E. Turcu ◽  
I. N. Ross ◽  
M. S. Schulz ◽  
H. Daido ◽  
G. J. Tallents ◽  
...  

2018 ◽  
Vol 167 ◽  
pp. 03001 ◽  
Author(s):  
Przemyslaw Wachulak ◽  
Alfio Torrisi ◽  
Mesfin Ayele ◽  
Andrzej Bartnik ◽  
Joanna Czwartos ◽  
...  

In this work we present three experimental, compact desk-top imaging systems: SXR and EUV full field microscopes and the SXR contact microscope. The systems are based on laser-plasma EUV and SXR sources based on a double stream gas puff target. The EUV and SXR full field microscopes, operating at 13.8 nm and 2.88 nm wavelengths are capable of imaging nanostructures with a sub-50 nm spatial resolution and short (seconds) exposure times. The SXR contact microscope operates in the “water-window” spectral range and produces an imprint of the internal structure of the imaged sample in a thin layer of SXR sensitive photoresist. Applications of such desk-top EUV and SXR microscopes, mostly for biological samples (CT26 fibroblast cells and Keratinocytes) are also presented. Details about the sources, the microscopes as well as the imaging results for various objects will be presented and discussed. The development of such compact imaging systems may be important to the new research related to biological, material science and nanotechnology applications.


2006 ◽  
Vol 86 (3) ◽  
pp. 519-522 ◽  
Author(s):  
J.A. Chakera ◽  
S.R. Kumbhare ◽  
P.A. Naik ◽  
P.D. Gupta

2012 ◽  
Vol 20 (16) ◽  
pp. 18362 ◽  
Author(s):  
H. Legall ◽  
G. Blobel ◽  
H. Stiel ◽  
W. Sandner ◽  
C. Seim ◽  
...  

2015 ◽  
Vol 107 (12) ◽  
pp. 121101 ◽  
Author(s):  
Thanh-Hung Dinh ◽  
Yuhei Suzuki ◽  
Goki Arai ◽  
Bowen Li ◽  
Padraig Dunne ◽  
...  

2019 ◽  
Vol 125 (5) ◽  
Author(s):  
P. W. Wachulak ◽  
A. Torrisi ◽  
W. Krauze ◽  
A. Bartnik ◽  
J. Kostecki ◽  
...  
Keyword(s):  
X Ray ◽  

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