scholarly journals Direct observation of chemical vapor deposited diamond films by atomic force microscopy

1992 ◽  
Vol 60 (13) ◽  
pp. 1567-1569 ◽  
Author(s):  
V. Baranauskas ◽  
M. Fukui ◽  
C. R. Rodrigues ◽  
N. Parizotto ◽  
V. J. Trava‐Airoldi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Diamond Films ◽  
Chemical Vapor ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chemical Vapor Deposited

scholarly journals Determination of PMMA Residues on a Chemical-Vapor-Deposited Monolayer of Graphene by Neutron Reflection and Atomic Force Microscopy

Langmuir ◽  
2018 ◽  
Vol 34 (5) ◽  
pp. 1827-1833 ◽  
Author(s):  
Ruiheng Li ◽  
Zongyi Li ◽  
Elias Pambou ◽  
Philipp Gutfreund ◽  
Thomas A. Waigh ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Vapor ◽  
Neutron Reflection ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chemical Vapor Deposited

DIRECT OBSERVATION BY ATOMIC FORCE MICROSCOPY OF SEVERAL BACTERIA SPECIES

1996 ◽  
Vol 86 (2-3) ◽  
pp. 193-193
Author(s):  
Denis ROBICHON ◽  
Jean-Franc¸ois CAVELLIER ◽  
Yves CENATIEMPO ◽  
Jean-Christophe GIRARD
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of polyhydroxyalkanoate chains by atomic force microscopy

2002 ◽  
Vol 91 (1-4) ◽  
pp. 157-164 ◽  
Author(s):  
Kumar Sudesh ◽  
Zhihua Gan ◽  
Ken’ichiro Matsumoto ◽  
Yoshiharu Doi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of surfactant aggregate behavior on a mica surface using high-speed atomic force microscopy

2011 ◽  
Vol 47 (17) ◽  
pp. 4974 ◽  
Author(s):  
Shigeto Inoue ◽  
Takayuki Uchihashi ◽  
Daisuke Yamamoto ◽  
Toshio Ando
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Mica Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aggregate Behavior

Direct observation of atomic step edges on the rutile TiO2(110)-(1 × 1) surface using atomic force microscopy

2018 ◽  
Vol 20 (44) ◽  
pp. 28331-28337 ◽  
Author(s):  
Huan Fei Wen ◽  
Masato Miyazaki ◽  
Quanzhen Zhang ◽  
Yuuki Adachi ◽  
Yan Jun Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Atomic Step ◽  
Atomic Configuration ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Step Edges

Clarifying the atomic configuration of step edges on a rutile TiO2 surface is crucial for understanding its fundamental reactivity, and the direct observation of atomic step edges is still a challenge.

scholarly journals Direct Observation of Rotary Catalysis of Rotorless F1-ATPase by High-Speed Atomic Force Microscopy

2012 ◽  
Vol 102 (3) ◽  
pp. 600a
Author(s):  
Ryota Iino ◽  
Takayuki Uchihashi ◽  
Toshio Ando ◽  
Hiroyuki Noji
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Force Microscopy ◽  
F1 Atpase ◽  
Atomic Force ◽  
Rotary Catalysis

Atomic force microscopy of (100), (110), and (111) homoepitaxial diamond films

1992 ◽  
Vol 71 (12) ◽  
pp. 5930-5940 ◽  
Author(s):  
L. F. Sutcu ◽  
C. J. Chu ◽  
M. S. Thompson ◽  
R. H. Hauge ◽  
J. L. Margrave ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diamond Films ◽  
Force Microscopy ◽  
Atomic Force
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