scholarly journals Composition and wavelength dependence of the refractive index in Cd1−xMnxTe epitaxial layers

1992 ◽  
Vol 60 (18) ◽  
pp. 2192-2194 ◽  
Author(s):  
D. W. Schubert ◽  
M. M. Kraus ◽  
R. Kenklies ◽  
C. R. Becker ◽  
R. N. Bicknell‐Tassius
Keyword(s):  
Refractive Index ◽  
Wavelength Dependence ◽  
Epitaxial Layers

Stress Whitening in Polypropylene. I. Light Scattering Theory and Model Experiments

1995 ◽  
Vol 60 (11) ◽  
pp. 1875-1887 ◽  
Author(s):  
Jaroslav Holoubek ◽  
Miroslav Raab
Keyword(s):  
Refractive Index ◽  
Light Scattering ◽  
Incident Light ◽  
Polymeric Materials ◽  
Wavelength Dependence ◽  
Theoretical Background ◽  
Surrounding Matrix ◽  
Embedded Particles ◽  
The One ◽  
Stress Whitening

Theoretical background for an optical method is presented which makes it possible to distinguish unambiguously between voids and particles as light scattering sites in polymeric materials. Typical dependences of turbidity as a function of diameter of scattering elements, their volume fractions and also turbidity curves as a function of the wavelength of the incident light were calculated, based both on the Lorenz-Mie theory and the fluctuation theory. Such dependences calculated for polypropylene-containing voids on the one hand and particles, differing only slightly from the surrounding matrix in their refractive index, on the other hand, are markedly different. The most significant results are: (i) Turbidity is at least by two orders of magnitude larger for voids in comparison to embedded particles of ethylene-propylene (EPDM) rubber of the same size, concentration and at the same wavelength. (ii) The wavelength dependence of turbidity for EPDM particles and the inherent refractive index fluctuations in the polypropylene matrix is much steeper as compared to voids for all considered diameters (0.1-10 μm). Thus, the nature of stress whitening in complex polymeric materials can be determined from turbidity measurements.

Temperature and wavelength dependence of refractive index of zircon and hafnon

2004 ◽  
Vol 26 (3) ◽  
pp. 305-311 ◽  
Author(s):  
Cameron Tanner ◽  
Karen Geisinger ◽  
Raja Wusirika
Keyword(s):  
Refractive Index ◽  
Wavelength Dependence

Determination of the thickness and spectral dependence of the refractive index of Al x In1 − x Sb epitaxial layers from reflectance spectra

2013 ◽  
Vol 47 (2) ◽  
pp. 292-297 ◽  
Author(s):  
O. S. Komkov ◽  
D. D. Firsov ◽  
A. N. Semenov ◽  
B. Ya. Meltser ◽  
S. I. Troshkov ◽  
...  
Keyword(s):  
Refractive Index ◽  
Spectral Dependence ◽  
Reflectance Spectra ◽  
Epitaxial Layers

scholarly journals Initial investigation of the wavelength dependence of optical properties measured with a new multi-pass Aerosol Extinction Differential Optical Absorption Spectrometer (AE-DOAS)

2012 ◽  
Vol 5 (4) ◽  
pp. 709-721 ◽  
Author(s):  
R. T. Chartier ◽  
M. E. Greenslade
Keyword(s):  
Refractive Index ◽  
Optical Absorption ◽  
Radiative Forcing ◽  
Wavelength Dependence ◽  
Polystyrene Latex ◽  
Light Extinction ◽  
Aerosol Extinction ◽  
New Instrument ◽  
The Impact ◽  
Absorption Spectrometer

Abstract. Atmospheric aerosols directly affect climate by scattering and absorbing radiation. The magnitude of the impact is dependent upon the wavelength of light, but is often estimated near 550 nm. When light scattering and absorption by aerosols is approximated, the wavelength dependence of the refractive index for specific components is lost. As a result, climate models would have inherent uncertainties for aerosol contributions to radiative forcing when considering the entire solar spectrum. An aerosol extinction differential optical absorption spectrometer has been developed to directly measure aerosol extinction at mid-ultraviolet to near infrared wavelengths. The instrument consists of a spectrometer coupled to a closed White-type multi-pass gas cell with an adjustable path length of up to approximately 20 m. Laboratory measurements of various gases are compared with known absorption cross sections. Additionally, the extinction of monodisperse samples of polystyrene latex spheres are measured and compared to Mie theory generated with refractive index values from the literature to validate the new instrument. The polystyrene experiments also emphasize the ability of the new instrument to retrieve the wavelength dependent refractive index, especially in the ultraviolet wavelength regions where variability is expected. The spectrometer will be a significant advancement for determining wavelength dependent complex refractive indices in future laboratory studies as well as provide the ability to monitor ambient aerosol light extinction.

scholarly journals Temperatures effects on cascaded Mach-Zehnder interferometer structures

2020 ◽  
Vol 9 (6) ◽  
pp. 2427-2435
Author(s):  
Ary Syahriar ◽  
Rahmat Alamtaha ◽  
Zulkifli Alamtaha ◽  
Putri Wulandari
Keyword(s):  
Refractive Index ◽  
Fiber Optics ◽  
Output Power ◽  
Wavelength Division Multiplexing ◽  
Transfer Matrix Method ◽  
Effective Refractive Index ◽  
Wavelength Dependence ◽  
Zehnder Interferometer ◽  
Wavelength Division ◽  
Mach Zehnder Interferometer

To increase bandwidth and number of channels per fiber for more than one wavelength in the same fiber the dense wavelength division multiplexing (DWDM) technology has been utilized. One of the devices that are important in DWDM is an optical interleaver. This paper discussed the effects of temperatures in the DWDM interleaver by using the Mach-Zehnder interferometer (MZI) structures which is arranged in two-stage cascaded MZI and the three-stage cascaded MZI geometries. The main consequences of increase temperature inside the fiber optics are the change of effective refractive index in the material of silica fiber due to the thermo-optics effects. In our analysis we have used the transfer matrix method to investigate the wavelength dependence of output power to the temperatures changes that varies from 30oC to 430ºC. In the calculation we have used the C-Band range wavelength which is around 1530 to 1565 nm. It has been shown that the change of temperatures may shift the wavelength inside the MZI output power in linear manners. These effects may be used to tune wavelength transmission inside the MZI structures to suit the ITU-T defined grid. 

Controllability And Homogeneity Of Optical Properties Of Thin Porous Silicon Films

1997 ◽  
Vol 486 ◽  
Author(s):  
S. Uehara ◽  
T. Kubo ◽  
S. Ogata ◽  
T. Sato ◽  
J. Hosono ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Porous Silicon ◽  
Optical Thickness ◽  
Wavelength Dependence ◽  
Effective Medium Approximation ◽  
Electrode Position ◽  
High Porosity ◽  
Optical Homogeneity ◽  
Reflection Spectroscopy

AbstractReflection spectroscopy was applied to evaluate the optical homogeneity and the refractive index of thin porous silicon (PS) layer. Variation in PS layer optical thickness was evaluated by measuring and mapping the reflectance over the surface area. For the circular anodization area of 17 mm diameter, the measured variation was less than 5 % on an area of 11 mm diameter. The anodization electrode position was found to have little influence on the homogeneity. A method to derive refractive index from a reflection spectrum is studied. The wavelength dependence of PS index measured by the method showed fair coincidence with the calculation based on effective medium approximation. In the two layer PS formation, optical thickness was found to change whether high porosity or low porosity layer is formed first.

scholarly journals Comparison of Integrated Optical Phase Shifters Designed in Different Regime

2018 ◽  
Vol 173 ◽  
pp. 01034
Author(s):  
Hao Chen ◽  
Haoran Meng ◽  
Xinyue Liu ◽  
Junke Ding ◽  
Jianguang Jiang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Wavelength Range ◽  
Phase Shifter ◽  
Wavelength Dependence ◽  
Phase Shifters ◽  
Length Difference ◽  
Integrated Optical ◽  
Refractive Index Difference ◽  
Fabrication Tolerance ◽  
Waveguide Core

A comparative study, in aspects of both wavelength dependence and fabrication tolerance, is carried out between silica-based phase shifters designed in two different regime, namely length difference regime and refractive index difference regime. Results show that in the wavelength range of 1500-1600 nm, phase shifter designed in refractive index difference regime has a working wavelength range 2.8~3.1 times wide as that designed in length difference regime; while in the aspect of fabrication tolerance, phase designed in length difference regime is advantageous, with respect to waveguide core dimension error, and waveguide core refractive index error as well.

Wavelength dependence of the refractive index

1987 ◽  
Vol 25 (8) ◽  
pp. 502-503 ◽  
Author(s):  
N. Gauthier
Keyword(s):  
Refractive Index ◽  
Wavelength Dependence
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