Insituextended x‐ray absorption fine structure spectroscopy of thin‐film nickel hydroxide electrodes

1991 ◽  
Vol 58 (8) ◽  
pp. 865-867 ◽  
Author(s):  
T. W. Capehart ◽  
D. A. Corrigan ◽  
R. S. Conell ◽  
K. I. Pandya ◽  
R. W. Hoffman
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
Nickel Hydroxide ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Optical Properties and X-ray Absorption Fine Structure Analysis of ZnS:Cu,Cl Thin-Film Phosphors

2010 ◽  
Vol 49 (8) ◽  
pp. 082602 ◽  
Author(s):  
Kunio Ichino ◽  
Haruki Kato ◽  
Yuichiro Sakai ◽  
Koutoku Ohmi ◽  
Tetsuo Honma ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Fine Structure ◽  
Structure Analysis ◽  
X Ray ◽  
Absorption Fine ◽  
Fine Structure Analysis ◽  
X Ray Absorption

scholarly journals Bayesian sparse modeling of extended x-ray absorption fine structure to determine interstitial oxygen positions in yttrium oxyhydride epitaxial thin film

AIP Advances ◽  
2021 ◽  
Vol 11 (12) ◽  
pp. 125013
Author(s):  
Hiroyuki Kumazoe ◽  
Yasuhiko Igarashi ◽  
Fabio Iesari ◽  
Ryota Shimizu ◽  
Yuya Komatsu ◽  
...  
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
Interstitial Oxygen ◽  
Epitaxial Thin Film ◽  
Sparse Modeling ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Refinement of free structure parameters of a thin film when only one reflection is available

2000 ◽  
Vol 33 (2) ◽  
pp. 252-258 ◽  
Author(s):  
Dirk C. Meyer ◽  
Peter Paufler
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
Energy Dependence ◽  
Epitaxial Layer ◽  
Structure Factor ◽  
Structure Parameters ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

A procedure is described to exploit measurements for the refinement of free structure parameters if only a few (or even only one) reflections are available. The method is illustrated taking an epitaxial layer of Ga0.5In0.5P deposited on (001)GaAs as an example, where the number of accessible reflections is limited by geometrical conditions. Another complication with this material arises from the well known ordering phenomenon, which occurred in a small part of the layer only. It is shown that the energy dependence of DAFS (diffraction anomalous fine structure) intensity is still sufficiently sensitive to values of free structure parameters when the oscillating part of the DAFS/XAFS (X-ray absorption fine structure) structure factor is ignored for evaluation of intensity. This facilitates evaluation of DAFS intensities considerably by avoiding time-consuming analysis of fine structure.

Study of α-Sexithienyl Thin Film by Polarized Near Edge X-ray Absorption Fine Structure

1996 ◽  
Vol 35 (Part 1, No. 5A) ◽  
pp. 2822-2825 ◽  
Author(s):  
Toshihiro Okajima ◽  
Satoru Narioka ◽  
Sachiko Tanimura ◽  
Kouji Hamano ◽  
Tetsuyuki Kurata ◽  
...  
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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