Elimination of dark line defects in GaAs‐on‐Si by post‐growth patterning and thermal annealing

1991 ◽  
Vol 58 (1) ◽  
pp. 74-76 ◽  
Author(s):  
Naresh Chand ◽  
S. N. G. Chu
Author(s):  
S. Yamakoshi ◽  
T. Sugahara ◽  
O. Hasegawa ◽  
Y. Toyama ◽  
H. Takanashi

1991 ◽  
Vol 111 (1-4) ◽  
pp. 429-433 ◽  
Author(s):  
Kanji Iizuka ◽  
Takashi Yoshida ◽  
Toshimasa Suzuki ◽  
Haruo Hirose

1995 ◽  
Vol 34 (Part 1, No. 6A) ◽  
pp. 2994-2999 ◽  
Author(s):  
Yoshiaki Hasegawa ◽  
TakashiEgawa ◽  
Takashi Jimbo ◽  
MasayoshiUmeno

1995 ◽  
Vol 187 (2) ◽  
pp. 451-456 ◽  
Author(s):  
K. P. O'Donnell ◽  
D. M. Bagnall ◽  
P. J. Wright ◽  
B. Cockayne

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