Transmission electron microscopy investigation of the recrystallization of an amorphous layer in Si+‐implanted silicon

G. Nabert; H.‐U. Habermeier

doi:10.1063/1.104375

Transmission electron microscopy investigation of the recrystallization of an amorphous layer in Si+‐implanted silicon

Applied Physics Letters ◽

10.1063/1.104375 ◽

1991 ◽

Vol 58 (10) ◽

pp. 1074-1076 ◽

Cited By ~ 6

Author(s):

G. Nabert ◽

H.‐U. Habermeier

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Amorphous Layer ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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Transmission electron microscopy investigation of borondoped polycrystalline chemically vapour-deposited diamond

Philosophical Magazine A ◽

10.1080/01418610210131029 ◽

2002 ◽

Vol 82 (9) ◽

pp. 1741-1768 ◽

Cited By ~ 4

Author(s):

J. W. Steeds ◽

A. E. Mora ◽

J. E. Butler ◽

K. M. Bussmann

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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Transmission electron microscopy investigation of texture development in magnesium oxide buffer layers

IEEE Transactions on Applied Superconductivity ◽

10.1109/77.919811 ◽

2001 ◽

Vol 11 (1) ◽

pp. 3473-3476 ◽

Cited By ~ 18

Author(s):

R.E. Koritala ◽

M.P. Chudzik ◽

Zhiping Luo ◽

D.J. Miller ◽

C.R. Kannewurf ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Magnesium Oxide ◽

Buffer Layers ◽

Texture Development ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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In situ scanning and transmission electron microscopy investigation on plastic deformation in a metastable β titanium alloy

Acta Materialia ◽

10.1016/j.actamat.2017.05.018 ◽

2017 ◽

Vol 133 ◽

pp. 21-29 ◽

Cited By ~ 36

Author(s):

Tingting Yao ◽

Kui Du ◽

Haoliang Wang ◽

Zhiye Huang ◽

Cuihong Li ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Plastic Deformation ◽

Titanium Alloy ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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In Situ Liquid Cell Transmission Electron Microscopy Investigation on the Dissolution-Regrowth Mechanism Dominating the Shape Evolution of Silver Nanoplates

Crystal Growth & Design ◽

10.1021/acs.cgd.0c01573 ◽

2021 ◽

Author(s):

Meng Dong ◽

Ruining Fu ◽

Huihua Min ◽

Qiubo Zhang ◽

Hui Dong ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Shape Evolution ◽

Transmission Electron Microscopy Investigation ◽

Silver Nanoplates ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Liquid Cell

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High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systems

Ultramicroscopy ◽

10.1016/0304-3991(94)90114-7 ◽

1994 ◽

Vol 54 (2-4) ◽

pp. 156-165 ◽

Cited By ~ 7

Author(s):

L.J. Chen ◽

J.M. Liang ◽

C.S. Liu ◽

W.Y. Hsieh ◽

J.H. Lin ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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Transmission electron microscopy investigation and first-principles calculation of the phase stability in epitaxial CuInS2 and CuGaSe2 films

Applied Physics Letters ◽

10.1063/1.123014 ◽

1999 ◽

Vol 74 (17) ◽

pp. 2483-2485 ◽

Cited By ~ 40

Author(s):

D. S. Su ◽

Su-Huai Wei

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Stability ◽

First Principles ◽

First Principles Calculation ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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5403. Transmission electron microscopy investigation of silicide formation on slightly oxidized silicon substrates

Vacuum ◽

10.1016/0042-207x(82)93999-9 ◽

1982 ◽

Vol 32 (12) ◽

pp. 773-774

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Silicon Substrates ◽

Transmission Electron Microscopy Investigation ◽

Silicide Formation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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A transmission electron microscopy investigation of filamentary superconducting composites

Journal of Materials Science ◽

10.1007/bf00566248 ◽

1977 ◽

Vol 12 (9) ◽

pp. 1862-1868 ◽

Cited By ~ 62

Author(s):

Anne W. West ◽

Rees D. Rawlings

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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In situ Transmission Electron Microscopy Investigation of Electroplasticity in Single Crystal Nickel

SSRN Electronic Journal ◽

10.2139/ssrn.3885861 ◽

2021 ◽

Author(s):

Xiaoqing Li ◽

John Turner ◽

Karen Bustillo ◽

Andrew M. Minor

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Single Crystal ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation

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In Situ Transmission Electron Microscopy Investigation of Dislocation Interactions

Handbook of Mechanics of Materials ◽

10.1007/978-981-10-6884-3_7 ◽

2019 ◽

pp. 131-166

Author(s):

Josh Kacher ◽

Ben P. Eftink ◽

Ian M. Robertson

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Investigation ◽

Transmission Electron ◽

Microscopy Investigation ◽

Electron Microscopy Investigation ◽

Dislocation Interactions

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