Excellent uniformity of threshold voltage of Si planar‐doped AlInAs/GaInAs heterointerface field‐effect transistors grown by metalorganic chemical vapor deposition

1990 ◽  
Vol 57 (5) ◽  
pp. 461-462 ◽  
Author(s):  
H. Ishikawa ◽  
H. Shibata ◽  
M. Kamada
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