X‐ray photoemission and Raman scattering spectroscopic study of surface modifications of silicon induced by electron cyclotron resonance etching

1990 ◽  
Vol 57 (6) ◽  
pp. 590-592 ◽  
Author(s):  
A. S. Yapsir ◽  
G. S. Oehrlein ◽  
G. Fortuño‐Wiltshire ◽  
J. C. Tsang
1993 ◽  
Vol 11 (4) ◽  
pp. 1186-1192 ◽  
Author(s):  
K. H. Chew ◽  
J. L. Shohet ◽  
T. J. Castagna ◽  
K. L. Seaward ◽  
F. F. Mertz

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