Measurements of the magnetic penetration depth in YBa2Cu3O7−δthin films by the microstrip resonator technique

1989 ◽  
Vol 54 (26) ◽  
pp. 2710-2712 ◽  
Author(s):  
Steven M. Anlage ◽  
Hsuan Sze ◽  
Howard J. Snortland ◽  
Shuichi Tahara ◽  
Brian Langley ◽  
...  
1990 ◽  
Vol 3 (3) ◽  
pp. 311-316 ◽  
Author(s):  
S. M. Anlage ◽  
B. W. Langley ◽  
H. J. Snortland ◽  
C. B. Eom ◽  
T. H. Geballe ◽  
...  

1990 ◽  
Vol 195 ◽  
Author(s):  
Steven M. Anlage ◽  
Brian W. Langley ◽  
Jurgen Halbritter ◽  
Chang-Beom Eom ◽  
Neil Switz ◽  
...  

ABSTRACTThe microstrip resonator technique has been applied to study the temperature dependence of the magnetic penetration depth in high quality YBa2Cu3O7−δ thin films. The temperature dependence at low temperatures comes out directly from measured data, with no assumptions about transmission line geometry, dielectric properties, or a model for the temperature dependence of the penetration depth. One can interpret the data in terms of either an exponential decay of λ(T) at low temperatures or as a power law decay. The energy gaps obtained from the exponential decay at low temperature are found to be significantly smaller than weak coupled BCS theory and power-law exponents are in the range of 1.3 to 3.2. These results will be discussed in terms of microscopic theories and the possibility that materials properties dominate the measurement.


2004 ◽  
Vol 272-276 ◽  
pp. 156-157 ◽  
Author(s):  
A Andreone ◽  
G.M De Luca ◽  
E Di Gennaro ◽  
G Lamura ◽  
M Salluzzo ◽  
...  

1991 ◽  
Vol 169 (1-4) ◽  
pp. 671-672 ◽  
Author(s):  
S.M. Anlage ◽  
B.W. Langley ◽  
G. Deutscher ◽  
R.W. Simon ◽  
J.M. Murduck ◽  
...  

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