Determination of single crystal elastic constants in textured polycrystalline materials: inverse approach coupling x-ray diffraction and self consistent model applied to a copper sample

2004 ◽  
Vol 92 (3-4) ◽  
pp. 29-34
Author(s):  
N. Guibert ◽  
L. Gosmain ◽  
Ch. Valot ◽  
C. Valot ◽  
K. Inal ◽  
...  
Keyword(s):  
Single Crystal ◽  
Elastic Constants ◽  
Copper Sample ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Inverse Approach ◽  
Consistent Model ◽  
Self Consistent

Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method

1988 ◽  
Vol 32 ◽  
pp. 459-469 ◽  
Author(s):  
Masanori Kurita ◽  
Ikuo Ihara ◽  
Nobuyuki Ono
Keyword(s):  
Residual Stress ◽  
Single Crystal ◽  
Elastic Constants ◽  
Stress Measurement ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Small Areas ◽  
Curve Method ◽  
The Continuum

The residual stress induced by grinding or some thermal treatment has a large effect on the strength of ceramics. The X-ray technique can be used to nondestructively measure the residual stress in small areas on the surface of polycrystalline materials. The X-ray stress measurement is based on. the continuum mechanics for macroscopically isotropic polycrystalline materials. In this method, the stress value is calculated selectively from strains of a particular diffraction plane in the grains which are favorably oriented for the diffraction. In general, however, the elastic constants of a single crystal depend on the plane of the lattice, since a single crystal is anisotropic, The behavior of the deformation of individual crystals in the aggregate of polycrystalline materials under applied stress has not yet been solved successfully. Therefore, the stress constant and elastic constants for a particular diffracting plane should be determined experimentally in order to determine the residual stress accurately by X-ray diffraction.

Study of Micromechanical Behaviour of Two Phase Polycrystalline Materials Using Diffraction and Self Consistent Model

2014 ◽  
Vol 783-786 ◽  
pp. 2059-2064
Author(s):  
Andrzej Baczmański ◽  
Elżbieta Gadalińska ◽  
Chedly Braham ◽  
Sebastian Wroński ◽  
Lea le Joncour ◽  
...  
Keyword(s):  
Lattice Strain ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
Two Phase ◽  
X Ray ◽  
Consistent Model ◽  
Self Consistent ◽  
In Situ Deformation ◽  
Specific Orientation

Diffraction methods for lattice strain measurement provide useful information concerning the nature of grains behaviour during elastoplastic deformation. The main advantage of the diffraction methods is the possibility of studying mechanical properties of polycrystalline materials separately in each phase and in groups of grains with a specific orientation. In this work we present application of the neutron and X-ray diffraction to study “in situ” deformation of two phase stainless steels during tensile loading. The experimental results are compared with self-consistent model.

Determination of single-crystal elasticity constants in a cubic phase within a multiphase alloy: X-ray diffraction measurements and inverse-scale transition modelling

2005 ◽  
Vol 38 (1) ◽  
pp. 30-37 ◽  
Author(s):  
S. Fréour ◽  
D. Gloaguen ◽  
M. François ◽  
A. Perronnet ◽  
R. Guillén
Keyword(s):  
Single Crystal ◽  
Elasticity Tensor ◽  
Cubic Phase ◽  
X Ray Diffraction ◽  
Two Phase ◽  
X Ray ◽  
Β Phase ◽  
Consistent Model ◽  
Transition Modelling

The scope of this work is the determination of single-crystal elastic properties from X-ray diffraction stress analysis performed on multiphase polycrystals. An explicit three-scale multiphase inverse self-consistent model is developed in order to express the single-crystal elasticity constants of a cubic phase as a function of its X-ray elasticity constants. The model is verified in the case of single-phase materials. Finally, it is applied to a two-phase (α+β) titanium-based alloy (Ti-17) and, as a result, the Ti-17 β-phase single-crystal elasticity tensor is estimated.

Synthesis of 4-(3-coumarinyl)-3-benzyl-4-thiazolin-2-one 4-methylbenzylidenehydrazone and determination of the isomeric structure by X-ray analysis

2003 ◽  
Vol 218 (12) ◽  
Author(s):  
Süheyla Özbey ◽  
Nilgün Karalı ◽  
Aysel Gürsoy
Keyword(s):  
Single Crystal ◽  
Diffraction Analysis ◽  
Spectral Data ◽  
X Ray Diffraction ◽  
X Ray ◽  
Isomeric Structure ◽  
Elemental Analyses

AbstractIn this study 4-(3-coumarinyl)-3-benzyl-4-thi azolin-2-one 4-methylbenzylidenehydrazone 3 was synthesised. An independent proof of the thiazolylhydrazone structure of 3 was achieved by single crystal X-ray diffraction analysis. Elemental analyses and spectral data (IR,

scholarly journals Magnetically Oriented Powder Crystal to Indexing and Structure Determination

2014 ◽  
Vol 70 (a1) ◽  
pp. C1560-C1560
Author(s):  
Fumiko Kimura ◽  
Wataru Oshima ◽  
Hiroko Matsumoto ◽  
Hidehiro Uekusa ◽  
Kazuaki Aburaya ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Single Crystal ◽  
Crystal Lattice ◽  
Powder Diffraction ◽  
Diffraction Method ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Lattice Parameters

In pharmaceutical sciences, the crystal structure is of primary importance because it influences drug efficacy. Due to difficulties of growing a large single crystal suitable for the single crystal X-ray diffraction analysis, powder diffraction method is widely used. In powder method, two-dimensional diffraction information is projected onto one dimension, which impairs the accuracy of the resulting crystal structure. To overcome this problem, we recently proposed a novel method of fabricating a magnetically oriented microcrystal array (MOMA), a composite in which microcrystals are aligned three-dimensionally in a polymer matrix. The X-ray diffraction of the MOMA is equivalent to that of the corresponding large single crystal, enabling the determination of the crystal lattice parameters and crystal structure of the embedded microcrytals.[1-3] Because we make use of the diamagnetic anisotropy of crystal, those crystals that exhibit small magnetic anisotropy do not take sufficient three-dimensional alignment. However, even for these crystals that only align uniaxially, the determination of the crystal lattice parameters can be easily made compared with the determination by powder diffraction pattern. Once these parameters are determined, crystal structure can be determined by X-ray powder diffraction method. In this paper, we demonstrate possibility of the MOMA method to assist the structure analysis through X-ray powder and single crystal diffraction methods. We applied the MOMA method to various microcrystalline powders including L-alanine, 1,3,5-triphenyl benzene, and cellobiose. The obtained MOMAs exhibited well-resolved diffraction spots, and we succeeded in determination of the crystal lattice parameters and crystal structure analysis.

scholarly journals Rubidium tetrafluoridobromate(III): redetermination of the crystal structure from single-crystal X-ray diffraction data

IUCrData ◽  
2019 ◽  
Vol 4 (11) ◽  
Author(s):  
Artem V. Malin ◽  
Sergei I. Ivlev ◽  
Roman V. Ostvald ◽  
Florian Kraus
Keyword(s):  
Crystal Structure ◽  
Single Crystal ◽  
Single Crystals ◽  
Diffraction Data ◽  
Structure Type ◽  
X Ray Diffraction ◽  
X Ray ◽  
Square Planar ◽  
Atomic Coordinates

Single crystals of rubidium tetrafluoridobromate(III), RbBrF4, were grown by melting and recrystallizing RbBrF4 from its melt. This is the first determination of the crystal structure of RbBrF4 using single-crystal X-ray diffraction data. We confirmed that the structure contains square-planar [BrF4]− anions and rubidium cations that are coordinated by F atoms in a square-antiprismatic manner. The compound crystallizes in the KBrF4 structure type. Atomic coordinates and bond lengths and angles were determined with higher precision than in a previous report based on powder X-ray diffraction data [Ivlev et al. (2015). Z. Anorg. Allg. Chem. 641, 2593–2598].

scholarly journals Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction

2020 ◽  
Vol 53 (1) ◽  
pp. 99-106
Author(s):  
Andreas Johannes ◽  
Jura Rensberg ◽  
Tilman A. Grünewald ◽  
Philipp Schöppe ◽  
Maurizio Ritzer ◽  
...  
Keyword(s):  
Surface Tension ◽  
Single Crystal ◽  
Spatial Resolution ◽  
Deformation Tensor ◽  
X Ray Diffraction ◽  
Projected Area ◽  
Absolute Value ◽  
X Ray ◽  
Grown Single Crystal

This work showcases a method to map the full deformation tensor in a single micro-sized crystal. It is shown that measuring the position of two Bragg reflections in reciprocal space is sufficient to obtain the full deformation tensor, if the condition of incompressibility of the material is imposed. This method is used to reveal the surface tension induced deformation at the edges of an as-grown single-crystal VO2 microwire. All components of the deformation tensor of the microwire were measured down to an absolute value of 10−4 in an 8 × 14 µm projected area of the wire. With a beam-defined spatial resolution of 150 × 150 nm, the measurement time was merely 2.5 h.

Crystal structure determination of Ag2Ga by single crystal X-ray diffraction

1998 ◽  
Vol 213 (12) ◽  
Author(s):  
A. E. Gunnæs ◽  
A. Olsen ◽  
P. T. Zagierski ◽  
B. Klewe ◽  
O. B. Karlsen ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Single Crystal ◽  
Structure Determination ◽  
Crystal Structure Determination ◽  
X Ray Diffraction ◽  
X Ray

AbstractThe crystal structure of

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