FIELD ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-381-C8-385
Author(s):  
T. J. GODFREY ◽  
R. P. SETNA ◽  
G. D.W. SMITH
Keyword(s):  
Atom Probe ◽  
Field Ion Microscopy ◽  
Ion Microscopy

scholarly journals Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data

2017 ◽  
Vol 23 (2) ◽  
pp. 255-268 ◽  
Author(s):  
Michal Dagan ◽  
Baptiste Gault ◽  
George D. W. Smith ◽  
Paul A. J. Bagot ◽  
Michael P. Moody
Keyword(s):  
Three Dimensional ◽  
Reconstruction Algorithm ◽  
Automated Analysis ◽  
Atom Probe ◽  
Crystal Defects ◽  
Steel Matrix ◽  
Field Evaporation ◽  
Field Ion Microscopy ◽  
Ion Microscopy ◽  
Microscopy Data

AbstractAn automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on the specimen’s surface, evolving subject to field evaporation, in a series of two-dimensional (2D) images. Its unique spatial resolution enables direct imaging of crystal defects as small as single vacancies. To fully exploit FIM’s potential, automated analysis tools are required. The reconstruction algorithm developed here relies on minimal assumptions and is sensitive to atomic coordinates of all imaged atoms. It tracks the atoms across a sequence of images, allocating each to its respective crystallographic plane. The result is a highly accurate 3D lattice-resolved reconstruction. The procedure is applied to over 2000 tungsten atoms, including ion-implanted planes. The approach is further adapted to analyze carbides in a steel matrix, demonstrating its applicability to a range of materials. A vast amount of information is collected during the experiment that can underpin advanced analyses such as automated detection of “out of sequence” events, subangstrom surface displacements and defects effects on neighboring atoms. These analyses have the potential to reveal new insights into the field evaporation process and contribute to improving accuracy and scope of 3D FIM and atom probe characterization.

Atom-probe field ion microscopy

1992 ◽  
Vol 107 (3-6) ◽  
pp. 95-104 ◽  
Author(s):  
Manfred Leisch
Keyword(s):  
Atom Probe ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy
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