FIELD EVAPORATION OF n-Ge (111) IN HYDROGEN AND DECOMPOSITION OF GeH4 IN HIGH ELECTROSTATIC FIELDS

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-135-C8-140
Author(s):  
C. MAINKA ◽  
W. DRACHSEL ◽  
J. H. BLOCK ◽  
G. KOZLOWSKI
Keyword(s):  
Field Evaporation ◽  
Electrostatic Fields

On the Shape of Field-Ion Emitters

1976 ◽  
Vol 34 ◽  
pp. 520-521
Author(s):  
H.C. Eaton ◽  
B.N. Ranganathan ◽  
T.W. Burwinkle ◽  
R. J. Bayuzick ◽  
J.J. Hren
Keyword(s):  
Grain Boundary ◽  
Spherical Shape ◽  
Theoretical Strength ◽  
Evaporation Process ◽  
Field Evaporation ◽  
Geometric Information ◽  
Field Ion Microscopy ◽  
Considerable Error ◽  
True Shape ◽  
Ion Microscopy

The shape of the emitter is of cardinal importance to field-ion microscopy. First, the field evaporation process itself is closely related to the initial tip shape. Secondly, the imaging stress, which is near the theoretical strength of the material and intrinsic to the imaging process, cannot be characterized without knowledge of the emitter shape. Finally, the problem of obtaining quantitative geometric information from the micrograph cannot be solved without knowing the shape. Previously published grain-boundary topographies were obtained employing an assumption of a spherical shape (1). The present investigation shows that the true shape deviates as much as 100 Å from sphericity and boundary reconstructions contain considerable error as a result.Our present procedures for obtaining tip shape may be summarized as follows. An empirical projection, D=f(θ), is obtained by digitizing the positions of poles on a field-ion micrograph.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

ENERGY SPREADS IN FIELD EVAPORATION AND LIQUID-METAL ION SOURCES

1984 ◽  
Vol 45 (C9) ◽  
pp. C9-179-C9-182
Author(s):  
G. L.R. Mair ◽  
T. Mulvey ◽  
R. G. Forbes
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Ion Sources ◽  
Field Evaporation

KINETICS OF FIELD EVAPORATION OF GALLIUM PHOSPHIDE IN THE PRESENCE OF HYDROGEN

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-141-C8-146
Author(s):  
A. GAUSSMANN ◽  
W. DRACHSEL ◽  
J. H. BLOCK
Keyword(s):  
Gallium Phosphide ◽  
Field Evaporation ◽  
Kinetics Of

scholarly journals Beam Theory of Thermal–Electro-Mechanical Coupling for Single-Wall Carbon Nanotubes

Nanomaterials ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 923
Author(s):  
Kun Huang ◽  
Ji Yao
Keyword(s):  
Mechanical Properties ◽  
Carbon Nanotubes ◽  
Beam Theory ◽  
Bending Stiffness ◽  
Single Wall Carbon Nanotubes ◽  
Beam Model ◽  
Euler Beam ◽  
New Model ◽  
Mechanical Coupling ◽  
Electrostatic Fields

The potential application field of single-walled carbon nanotubes (SWCNTs) is immense, due to their remarkable mechanical and electrical properties. However, their mechanical properties under combined physical fields have not attracted researchers’ attention. For the first time, the present paper proposes beam theory to model SWCNTs’ mechanical properties under combined temperature and electrostatic fields. Unlike the classical Bernoulli–Euler beam model, this new model has independent extensional stiffness and bending stiffness. Static bending, buckling, and nonlinear vibrations are investigated through the classical beam model and the new model. The results show that the classical beam model significantly underestimates the influence of temperature and electrostatic fields on the mechanical properties of SWCNTs because the model overestimates the bending stiffness. The results also suggest that it may be necessary to re-examine the accuracy of the classical beam model of SWCNTs.

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