ATOM-PROBE FIELD-ION MICROSCOPY OF HIGH-TEMPERATURE SUPERCONDUCTING MATERIALS

G. ZAHARCHUK; L.v. ALVENSLEBEN; M. OEHRING; P. HAASEN

doi:10.1051/jphyscol:1988680

ATOM-PROBE FIELD-ION MICROSCOPY OF HIGH-TEMPERATURE SUPERCONDUCTING MATERIALS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988680 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-471-C6-476 ◽

Cited By ~ 1

Author(s):

G. ZAHARCHUK ◽

L.v. ALVENSLEBEN ◽

M. OEHRING ◽

P. HAASEN

Keyword(s):

High Temperature ◽

Atom Probe ◽

Superconducting Materials ◽

Probe Field ◽

Field Ion Microscopy ◽

High Temperature Superconducting ◽

Ion Microscopy

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AN ATOM PROBE FIELD ION MICROSCOPY STUDY OF DISLOCATION-SOLUTE INTERACTIONS NEAR TWIN BOUNDARIES IN WEB SILICON

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988685 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-503-C6-507 ◽

Cited By ~ 2

Author(s):

R. JAYARAM ◽

J. A. SPITZNAGEL

Keyword(s):

Atom Probe ◽

Microscopy Study ◽

Twin Boundaries ◽

Probe Field ◽

Field Ion Microscopy ◽

Solute Interactions ◽

Ion Microscopy

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Microstructural development in PWA-1480 electron beam welds — an atom probe field ion microscopy study

Applied Surface Science ◽

10.1016/0169-4332(95)00387-8 ◽

1996 ◽

Vol 94-95 ◽

pp. 280-287 ◽

Cited By ~ 9

Author(s):

S.S. Babu ◽

S.A. David ◽

M.K. Miller

Keyword(s):

Electron Beam ◽

Atom Probe ◽

Microscopy Study ◽

Microstructural Development ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science Letters ◽

10.1016/0167-2584(82)90422-4 ◽

1982 ◽

Vol 120 (1) ◽

pp. A329

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

Ion Microscopy

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Chemical Homogeneity of NiPdP Metallic Glasses Studied by Atom Probe-Field Ion Microscopy / Feldionenmikroskop- und Atomsonden-Untersuchungen zur chemischen Homogenität metallener NiPdP-Gläser

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.1515/ijmr-1989-800101 ◽

1989 ◽

Vol 80 (1) ◽

pp. 1-8

Author(s):

Michael Oehring

Keyword(s):

Metallic Glasses ◽

Atom Probe ◽

Probe Field ◽

Chemical Homogeneity ◽

Field Ion Microscopy ◽

Ion Microscopy

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