STUDY OF FIELD INDUCED HOT-ELECTRON EMISSION USING THE COMPOSITE MICROEMITTERS WITH VARYING DIELECTRIC LAYER THICKNESS
1987 ◽
Vol 48
(C6)
◽
pp. C6-115-C6-120
◽
1982 ◽
Vol 65
(2)
◽
pp. 116-124
Keyword(s):
2019 ◽
Vol 14
(12)
◽
pp. C12003-C12003
◽
1986 ◽
Vol 47
(C7)
◽
pp. C7-139-C7-144
◽
2013 ◽
Vol 52
(4R)
◽
pp. 046201
◽