ENHANCED SURFACE WAVE CONVOLVER USING A PIEZOELECTRIC SEMICONDUCTOR

This paper presents a novel radio-frequency identification (RFID) sensing system using enhanced surface wave technology for battery exchange stations (BESs) of electric motorcycles. Ultrahigh-frequency (UHF) RFID technology is utilized to automatically track and manage battery and user information without manual operation. The system includes readers, enhanced surface wave leaky cable antennas (ESWLCAs), coupling cable lines (CCLs), and small radiation patches (SRPs). The RFID sensing system overcomes the electromagnetic interference in the metallic environment of a BES cabinet. The developed RFID sensing system can effectively increase the efficiency of BES operation and promote the development of electric vehicles which solve the problem of air pollution as well as protect the environment of the Earth.

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Ellipsometric Monitoring of First Stages of Diamond Nucleation in a Bias-Enhanced Surface-Wave-Excited Microwave Plasma

Japanese Journal of Applied Physics ◽

10.1143/jjap.38.4508 ◽

1999 ◽

Vol 38 (Part 1, No. 7B) ◽

pp. 4508-4511 ◽

Cited By ~ 2

Author(s):

Yasuaki Hayashi ◽

Hideto Nakamura ◽

Masaaki Nagahiro ◽

Shigehiro Nishino

Keyword(s):

Surface Wave ◽

Microwave Plasma ◽

Diamond Nucleation ◽

Enhanced Surface

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Acoustic convolution using nonlinear surface-wave interactions in a piezoelectric semiconductor

Electronics Letters ◽

10.1049/el:19710476 ◽

1971 ◽

Vol 7 (23) ◽

pp. 696 ◽

Cited By ~ 18

Author(s):

C.W. Turner ◽

I.M. Mason ◽

J. Chambers

Keyword(s):

Surface Wave ◽

Wave Interactions ◽

Piezoelectric Semiconductor ◽

Nonlinear Surface

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Exit-surface wave reconstruction using a focal series

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129577 ◽

1992 ◽

Vol 50 (2) ◽

pp. 988-989

Author(s):

W.J. de Ruijter ◽

M.R. McCartney ◽

David J. Smith ◽

J.K. Weiss

Keyword(s):

Surface Wave ◽

Spherical Aberration ◽

Data Extraction ◽

High Sensitivity ◽

Geometric Distortion ◽

Variation Method ◽

Objective Lens ◽

Immediate Reconstruction ◽

Exit Surface ◽

Electron Microscopes

Further advances in resolution enhancement of transmission electron microscopes can be expected from digital processing of image data recorded with slow-scan CCD cameras. Image recording with these new cameras is essential because of their high sensitivity, extreme linearity and negligible geometric distortion. Furthermore, digital image acquisition allows for on-line processing which yields virtually immediate reconstruction results. At present, the most promising techniques for exit-surface wave reconstruction are electron holography and the recently proposed focal variation method. The latter method is based on image processing applied to a series of images recorded at equally spaced defocus.Exit-surface wave reconstruction using the focal variation method as proposed by Van Dyck and Op de Beeck proceeds in two stages. First, the complex image wave is retrieved by data extraction from a parabola situated in three-dimensional Fourier space. Then the objective lens spherical aberration, astigmatism and defocus are corrected by simply dividing the image wave by the wave aberration function calculated with the appropriate objective lens aberration coefficients which yields the exit-surface wave.

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