THE INFLUENCE OF PATH-DIFFERENCE IN A DISPERSIVE MEDIUM ON TWO-BEAM INTERFERENCE

1967 ◽  
Vol 28 (C2) ◽  
pp. C2-17-C2-17
Author(s):  
H. H. HOPKINS
Keyword(s):  
Dispersive Medium ◽  
Path Difference

Observation of surface morphology by reflection electron holography

1989 ◽  
Vol 47 ◽  
pp. 536-537
Author(s):  
N. Osakabe ◽  
J. Endo ◽  
T. Matsuda ◽  
A. Tonomura
Keyword(s):  
Phase Shift ◽  
Surface Morphology ◽  
High Sensitivity ◽  
High Energy ◽  
Path Difference ◽  
Transmission Mode ◽  
Electron Holography ◽  
Dynamical Process ◽  
High Vertical Resolution ◽  
Amplification Technique

Progress in microscopy such as STM and TEM-TED has revealed surface structures in atomic dimension. REM has been used for the observation of surface dynamical process and surface morphology. Recently developed reflection electron holography, which employes REM optics to measure the phase shift of reflected electron, has been proved to be effective for the observation of surface morphology in high vertical resolution ≃ 0.01 Å.The key to the high sensitivity of the method is best shown by comparing the phase shift generation by surface topography with that in transmission mode. Difference in refractive index between vacuum and material Vo/2E≃10-4 owes the phase shift in transmission mode as shownn Fig. 1( a). While geometrical path difference is created in reflection mode( Fig. 1(b) ), which is measured interferometrically using high energy electron beam of wavelength ≃0.01 Å. Together with the phase amplification technique , the vertivcal resolution is expected to be ≤0.01 Å in an ideal case.

LIMITING PRECISION IN OPTICAL INTERFEROMETRY

1959 ◽  
Vol 37 (11) ◽  
pp. 1283-1292 ◽  
Author(s):  
G. R. Hanes
Keyword(s):  
Path Difference ◽  
Optical Interferometry ◽  
Experimental Conditions ◽  
Photon Noise ◽  
Fundamental Limit

The fundamental limit to the precision of setting on a fringe peak due to photon noise is evaluated for a certain class of interferometric methods in terms of parameters characterizing the source, the interferometer, and the detector. It is shown that changes in path difference of 10−10 should be detectable with an observing time of 1 second, using only modest equipment. Some of the experimental conditions required to attain this precision are discussed.

Peak-to-peak tracking method for measurement of optical path difference: Revisited

Optik ◽  
2015 ◽  
Vol 126 (24) ◽  
pp. 5420-5422
Author(s):  
H.H. Ley ◽  
A. Yahaya ◽  
Y. Munajat
Keyword(s):  
Optical Path Difference ◽  
Path Difference ◽  
Optical Path ◽  
Tracking Method ◽  
Peak Tracking

scholarly journals Phase-space studies of backscattering diffraction of defective Schrödinger cat states

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Damian Kołaczek ◽  
Bartłomiej J. Spisak ◽  
Maciej Wołoszyn
Keyword(s):  
Phase Space ◽  
Dispersive Medium ◽  
Wigner Distribution ◽  
Interference Term ◽  
Wigner Distribution Function ◽  
The Subject ◽  
Schrödinger Cat ◽  
Cat States ◽  
Schrodinger Cat State ◽  
Space Approach

AbstractThe coherent superposition of two well separated Gaussian wavepackets, with defects caused by their imperfect preparation, is considered within the phase-space approach based on the Wigner distribution function. This generic state is called the defective Schrödinger cat state due to this imperfection which significantly modifies the interference term. Propagation of this state in the phase space is described by the Moyal equation which is solved for the case of a dispersive medium with a Gaussian barrier in the above-barrier reflection regime. Formally, this regime constitutes conditions for backscattering diffraction phenomena. Dynamical quantumness and the degree of localization in the phase space of the considered state as a function of its imperfection are the subject of the performed analysis. The obtained results allow concluding that backscattering communication based on the defective Schrödinger cat states appears to be feasible with existing experimental capabilities.

Is the ether a dispersive medium?

1908 ◽  
Vol 165 (6) ◽  
pp. 469-471
Author(s):  
Paul R. Heyl
Keyword(s):  
Dispersive Medium
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