A potential X-pinch based point X-ray source for phase contrast imaging of inertial confinement fusion capsules

2006 ◽  
Vol 133 ◽  
pp. 761-765
Author(s):  
R. B. Stephens ◽  
F. N. Beg ◽  
B. DeBono ◽  
S. M. Eddinger ◽  
D. Hass ◽  
...  
Keyword(s):  
Inertial Confinement Fusion ◽  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Inertial Confinement ◽  
Contrast Imaging ◽  
X Ray ◽  
Confinement Fusion

Compact X-pinch based point x-ray source for phase contrast imaging of inertial confinement fusion capsules

2006 ◽  
Vol 89 (10) ◽  
pp. 101502 ◽  
Author(s):  
F. N. Beg ◽  
R. B. Stephens ◽  
H.-W. Xu ◽  
D. Haas ◽  
S. Eddinger ◽  
...  
Keyword(s):  
Inertial Confinement Fusion ◽  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Inertial Confinement ◽  
Contrast Imaging ◽  
X Ray ◽  
Confinement Fusion

scholarly journals Quantitative characterization of inertial confinement fusion capsules using phase contrast enhanced x-ray imaging

2005 ◽  
Vol 97 (6) ◽  
pp. 063103 ◽  
Author(s):  
B. J. Kozioziemski ◽  
J. A. Koch ◽  
A. Barty ◽  
H. E. Martz ◽  
Wah-Keat Lee ◽  
...  
Keyword(s):  
Inertial Confinement Fusion ◽  
Phase Contrast ◽  
Inertial Confinement ◽  
Quantitative Characterization ◽  
X Ray ◽  
X Ray Imaging ◽  
Contrast Enhanced ◽  
Confinement Fusion

Analysis of electroless nickel thin films

1991 ◽  
Vol 49 ◽  
pp. 510-511 ◽  
Author(s):  
C. W. Price ◽  
E. F. Lindsey
Keyword(s):  
Thin Films ◽  
Inertial Confinement Fusion ◽  
Electroless Nickel ◽  
Inertial Confinement ◽  
Plating Bath ◽  
X Ray ◽  
Nickel Thin Films ◽  
Nickel Deposits ◽  
Confinement Fusion ◽  
Thickness Measurements

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.

Image Quality Analysis of X-ray Grating Interferometer Using Integrating-bucket Method

2020 ◽  
Vol 64 (2) ◽  
pp. 20503-1-20503-5
Author(s):  
Faiz Wali ◽  
Shenghao Wang ◽  
Ji Li ◽  
Jianheng Huang ◽  
Yaohu Lei ◽  
...  
Keyword(s):  
Image Quality ◽  
Phase Contrast ◽  
Quality Analysis ◽  
Phase Contrast Imaging ◽  
Phase Image ◽  
Contrast Imaging ◽  
High Quality ◽  
Image Quality Analysis ◽  
X Ray ◽  
Grating Interferometer

Abstract Grating-based x-ray phase-contrast imaging has the potential to enhance image quality and provide inner structure details non-destructively. In this work, using grating-based x-ray phase-contrast imaging system and employing integrating-bucket method, the quantitative expressions of signal-to-noise ratios due to photon statistics and mechanical error are analyzed in detail. Photon statistical noise and mechanical error are the main sources affecting the image noise in x-ray grating interferometry. Integrating-bucket method is a new phase extraction method translated to x-ray grating interferometry; hence, its image quality analysis would be of great importance to get high-quality phase image. The authors’ conclusions provide an alternate method to get high-quality refraction signal using grating interferometer, and hence increases applicability of grating interferometry in preclinical and clinical usage.

Numerical analysis of shift error in X-ray phase contrast imaging for large field of view

2017 ◽  
Vol 34 (1) ◽  
pp. 8
Author(s):  
Jianheng Huang ◽  
Yaohu Lei ◽  
Xin Liu ◽  
Jinchuan Guo ◽  
Ji Li ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
Phase Contrast ◽  
Field Of View ◽  
Phase Contrast Imaging ◽  
Large Field ◽  
Contrast Imaging ◽  
X Ray
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