scholarly journals Ti-Pd-Ni high temperature shape memory thin films formed with carousel type magnetron sputtering apparatus

2001 ◽  
Vol 11 (PR8) ◽  
pp. Pr8-427-Pr8-432 ◽  
Author(s):  
T. Sawaguchi ◽  
M. Sato ◽  
A. Ishida
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Magnetron Sputtering ◽  
Shape Memory

Growth of Ni–Mn–Ga high-temperature shape memory alloy thin films by magnetron sputtering technique

2010 ◽  
Vol 256 (22) ◽  
pp. 6655-6659 ◽  
Author(s):  
C. Liu ◽  
H.W. Mu ◽  
L.X. Gao ◽  
W.J. Ma ◽  
X. An ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Shape Memory Alloy ◽  
Magnetron Sputtering ◽  
Shape Memory

Shape memory thin films formed with carrousel-type magnetron sputtering apparatus

2005 ◽  
Vol 14 (5) ◽  
pp. S216-S222 ◽  
Author(s):  
Akira Ishida ◽  
Morio Sato ◽  
Osamu Tabata ◽  
Wataru Yoshikawa
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Shape Memory

scholarly journals Comparative Study of ZnO Thin Films Grown on Quartz Glass and Sapphire (001) Substrates by Means of Magnetron Sputtering and High-Temperature Annealing

2019 ◽  
Vol 9 (21) ◽  
pp. 4509
Author(s):  
Weijia Yang ◽  
Fengming Wang ◽  
Zeyi Guan ◽  
Pengyu He ◽  
Zhihao Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Magnetron Sputtering ◽  
Comparative Study ◽  
Quartz Glass ◽  
Photoelectron Spectroscopy ◽  
Zno Thin Films ◽  
High Temperature Annealing ◽  
X Ray ◽  
Glass Substrates

In this work, we reported a comparative study of ZnO thin films grown on quartz glass and sapphire (001) substrates through magnetron sputtering and high-temperature annealing. Firstly, the ZnO thin films were deposited on the quartz glass and sapphire (001) substrates in the same conditions by magnetron sputtering. Afterwards, the sputtered ZnO thin films underwent an annealing process at 600 °C for 1 h in an air atmosphere to improve the quality of the films. X-ray diffraction, scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy (XPS), ultraviolet-visible spectra, photoluminescence spectra, and Raman spectra were used to investigate the structural, morphological, electrical, and optical properties of the both as-received ZnO thin films. The ZnO thin films grown on the quartz glass substrates possess a full width of half maximum value of 0.271° for the (002) plane, a surface root mean square value of 0.50 nm and O vacancies/defects of 4.40% in the total XPS O 1s peak. The comparative investigation reveals that the whole properties of the ZnO thin films grown on the quartz glass substrates are comparable to those grown on the sapphire (001) substrates. Consequently, ZnO thin films with high quality grown on the quartz glass substrates can be achieved by means of magnetron sputtering and high-temperature annealing at 600 °C.

Raman scattering from sputtered films of YBa2Cu3Oy

1988 ◽  
Vol 66 (8) ◽  
pp. 695-699 ◽  
Author(s):  
J. Chrzanowski ◽  
J. C. Irwin ◽  
R. R. Parsons ◽  
P. J. Mulhern
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Magnetron Sputtering ◽  
Raman Scattering ◽  
Oxygen Content ◽  
High Temperature Superconductor ◽  
Superconducting Films ◽  
Vibrational Modes ◽  
Dc Magnetron Sputtering ◽  
Sputtered Films

Thin films of the high-temperature superconductor YBa2Cu3Oy have been deposited on Al2O3 and MgO substrates by dc magnetron sputtering. Raman-scattering experiments have been carried out on these films at various temperatures. The results of these experiments have been used to estimate the amount of impurity phases in the films, to characterize the actual superconducting films, and to test for any preferential orientation within the film. Vibrational modes of the superconductor were found at 148, 226, and 338 cm−1 in both sets of films, at 446 and 491 cm−1 in the Al2O3 films, and at 441 and 500 cm−1 in the MgO films. The measured frequencies of the highest energy modes have been used to determine the oxygen content of the films.

Shape memory behavior of high temperature Ti–Ni–Pt thin films

2006 ◽  
Vol 515 (4) ◽  
pp. 1938-1941 ◽  
Author(s):  
Mohanchandra K. Panduranga ◽  
Daniel D. Shin ◽  
Gregory P. Carman
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Shape Memory ◽  
Shape Memory Behavior

Influence of desorption on the composition of high-temperature superconducting thin films during magnetron sputtering

1998 ◽  
Vol 24 (12) ◽  
pp. 952-953
Author(s):  
A. K. Vorob’ev ◽  
S. V. Gaponov ◽  
M. N. Drozdov ◽  
E. B. Klyuenkov ◽  
V. I. Luchin ◽  
...  
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Magnetron Sputtering ◽  
Superconducting Thin Films ◽  
High Temperature Superconducting
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