Effects induced by electron beam irradiation on the properties of Y1Ba2Cu3O7-x biepitaxial Josephson junctions

1998 ◽  
Vol 08 (PR3) ◽  
pp. Pr3-289-Pr3-292
Author(s):  
F. Tafuri ◽  
B. Nadgorny ◽  
S. Shokhor ◽  
M. Gurvitch ◽  
F. Lombardi ◽  
...  
Keyword(s):  
Electron Beam ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Beam Irradiation

High-T/sub c/ Josephson junctions by electron beam irradiation

1993 ◽  
Vol 3 (1) ◽  
pp. 2405-2408 ◽  
Author(s):  
A.J. Pauza ◽  
A.M. Campbell ◽  
D.F. Moore ◽  
R.E. Somekh ◽  
A.N. Broers
Keyword(s):  
Electron Beam ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Beam Irradiation

Barrier properties inYBa2Cu3O7−xgrain-boundary Josephson junctions using electron-beam irradiation

1998 ◽  
Vol 57 (22) ◽  
pp. R14076-R14079 ◽  
Author(s):  
F. Tafuri ◽  
B. Nadgorny ◽  
S. Shokhor ◽  
M. Gurvitch ◽  
F. Lombardi ◽  
...  
Keyword(s):  
Electron Beam ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Barrier Properties ◽  
Beam Irradiation

High Frequency Responses of YBa2Cu3O7-y Josephson Junctions on Si Substrates Fabricated by Focused Electron Beam Irradiation

1997 ◽  
Vol 36 (Part 2, No. 8B) ◽  
pp. L1096-L1099 ◽  
Author(s):  
Sang-Jae Kim ◽  
Hiroaki Myoren ◽  
Jian Chen ◽  
Kensuke Nakajima ◽  
Masayoshi Esashi
Keyword(s):  
Electron Beam ◽  
High Frequency ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Si Substrates ◽  
Frequency Responses

Josephson junctions in YBa2Cu3O7−δ by electron beam irradiation

1994 ◽  
Vol 194-196 ◽  
pp. 119-120 ◽  
Author(s):  
A.J. Pauza ◽  
A.M. Campbell ◽  
D.F. Moore ◽  
R.E. Somekh ◽  
A.N. Broers
Keyword(s):  
Electron Beam ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Beam Irradiation

Phenomenology of YBa2Cu3O7-x Grain Boundary Josephson Junctions Irradiated by an Electron Beam

1999 ◽  
Vol 13 (09n10) ◽  
pp. 1307-1314
Author(s):  
F. Tafuri ◽  
B. Nadgorny ◽  
S. Shokor ◽  
M. Gurvitch ◽  
F. Carillo ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Electron Beam ◽  
Grain Boundary ◽  
Electron Irradiation ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Isothermal Annealing ◽  
Barrier Thickness ◽  
Beam Irradiation ◽  
Frequency Tunability

Electron beam irradiation has been used to induce controllable variations in the properties of YBa 2 Cu 3 O 7-x biepitaxial grain boundary Josephson junctions. Electron irradiation decreased the critical current of the junctions IC and increased the normal state specific resistivities. The junction parameters can be adjusted controllably by applying an appropriate dose. The original properties of the junctions could be partly restored by isothermal annealing A correlation between the transport properties and the microstructure was obtained by determining the ratio of a barrier thickness to the dielectric constant of the junctions with different barriers. The experiment also demonstrates frequency tunability in a resonant soliton oscillator. Preliminar results of irradiation on (103) YBCO films have been given demonstrating differences from data on c -axis films, as partly expected from the anisotropy of these materials.

Modification of the properties of Y1Ba2Cu3O7−x biepitaxial Josephson junctions by electron beam irradiation

1998 ◽  
Vol 56 (2-3) ◽  
pp. 130-133
Author(s):  
F Tafuri ◽  
B Nadgorny ◽  
S Shokhor ◽  
M Gurvitch ◽  
F Lombardi ◽  
...  
Keyword(s):  
Electron Beam ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Beam Irradiation

Fabrication of Josephson Junctions by Focused Electron Beam Irradiation

1994 ◽  
Vol 33 (Part 2, No. 4B) ◽  
pp. L578-L580 ◽  
Author(s):  
Masanobu Suzuki ◽  
Nobuaki Kawahara ◽  
Hiroki Hoshizaki ◽  
Toru Imura
Keyword(s):  
Electron Beam ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Beam Irradiation

Electron beam irradiation of Y1Ba2Cu3O7−x grain boundary Josephson junctions

1997 ◽  
Vol 71 (1) ◽  
pp. 125-127 ◽  
Author(s):  
F. Tafuri ◽  
S. Shokhor ◽  
B. Nadgorny ◽  
M. Gurvitch ◽  
F. Lombardi ◽  
...  
Keyword(s):  
Electron Beam ◽  
Grain Boundary ◽  
Josephson Junctions ◽  
Electron Beam Irradiation ◽  
Beam Irradiation

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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