Low-Temperature Modelling of Electron-Velocity-Overshoot Effects on 70-250 nm Gate-Length MOSFETs
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-21-Pr3-24
Keyword(s):
1990 ◽
Vol 37
(4)
◽
pp. 935-941
◽
2011 ◽
Vol 50
◽
pp. 010107
◽
Keyword(s):
1985 ◽
Vol 6
(12)
◽
pp. 665-667
◽
2001 ◽
Vol 228
(2)
◽
pp. 585-588
◽