Multilayer diffraction grating properties

1994 ◽  
Vol 4 (9) ◽  
pp. 1649-1658
Author(s):  
A. Erko ◽  
V. Martynov ◽  
D. Roshchoupkin ◽  
A. Yuakshin ◽  
B. Vidal ◽  
...  
Keyword(s):  
Diffraction Grating ◽  
Multilayer Diffraction Grating

Multilayer diffraction grating (MDG) as a base of polaritonic optochemical sensor

2004 ◽  
Author(s):  
N.L. Dmitruk ◽  
V.V. Karpovych ◽  
O.I. Mayeva ◽  
I.B. Mamontova ◽  
O.S. Kondratenko ◽  
...  
Keyword(s):  
Diffraction Grating ◽  
Multilayer Diffraction Grating ◽  
Optochemical Sensor

scholarly journals DESIGN AND CHARACTERIZATION OF SURFACE BARRIER HETEROSTRUCTURES BASED ON MULTILAYER DIFFRACTION GRATING FOR OPTOELECTREONIC DEVICES

2007 ◽  
Vol 4 (3) ◽  
pp. 24-29
Author(s):  
M. V. Sosnova ◽  
M. L. Dmitruk ◽  
A. V. Korovin ◽  
O. I. Mayeva ◽  
S. V. Mamykin ◽  
...  
Keyword(s):  
Diffraction Grating ◽  
Surface Barrier ◽  
Multilayer Diffraction Grating

scholarly journals Development of High-Reflective W/Si-multilayer Diffraction Grating for the Analysis of Fluorine Materials

2015 ◽  
Vol 28 (4) ◽  
pp. 531-536 ◽  
Author(s):  
Masaki Kuki ◽  
Tomoyuki Uemura ◽  
Masato Yamaguchi ◽  
Tetsuo Harada ◽  
Takeo Watanabe ◽  
...  
Keyword(s):  
Diffraction Grating ◽  
Multilayer Diffraction Grating

Uniformity of Magnification from Different Electron Microscopes

1967 ◽  
Vol 25 ◽  
pp. 32-33
Author(s):  
Godfrey C. Hoskins ◽  
V. Williams ◽  
V. Allison
Keyword(s):  
Diffraction Grating ◽  
The Other ◽  
Carbon Replica ◽  
Electron Microscopes ◽  
The Stability

The method demonstrated is an adaptation of a proven procedure for accurately determining the magnification of light photomicrographs. Because of the stability of modern electrical lenses, the method is shown to be directly applicable for providing precise reproducibility of magnification in various models of electron microscopes.A readily recognizable area of a carbon replica of a crossed-line diffraction grating is used as a standard. The same area of the standard was photographed in Phillips EM 200, Hitachi HU-11B2, and RCA EMU 3F electron microscopes at taps representative of the range of magnification of each. Negatives from one microscope were selected as guides and printed at convenient magnifications; then negatives from each of the other microscopes were projected to register with these prints. By deferring measurement to the print rather than comparing negatives, correspondence of magnification of the specimen in the three microscopes could be brought to within 2%.

Shadow Theory of Diffraction Grating: Reciprocity, Symmetry and Average Filter

2014 ◽  
Vol E97.C (10) ◽  
pp. 1036-1040 ◽  
Author(s):  
Junichi NAKAYAMA ◽  
Yasuhiko TAMURA
Keyword(s):  
Diffraction Grating ◽  
Average Filter

Electrodynamic System for Diffraction Radiation Oscillators with Resonant Matching of Diffraction Grating

2008 ◽  
Vol 67 (7) ◽  
pp. 597-607
Author(s):  
M. Yu. Demchenko ◽  
V. S. Myroshnychenko ◽  
Yu. V. Svishchev ◽  
Ye. B. Senkevich
Keyword(s):  
Diffraction Grating ◽  
Diffraction Radiation ◽  
Electrodynamic System
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