Effects of temperature and series resistance on GaAs concentrator solar cell

2008 ◽  
Vol 41 (2) ◽  
pp. 115-119 ◽  
Author(s):  
S. Khelifi ◽  
L. Ayat ◽  
A. Belghachi
Keyword(s):  
Solar Cell ◽  
Series Resistance ◽  
Effects Of Temperature

All-Contactless Measurement of Series Resistance Distributions on Solar Cells with Photoluminescence Imaging

2011 ◽  
Author(s):  
M. Kasemann ◽  
L.M. Reindl ◽  
B. Michl ◽  
W. Warta ◽  
A. Schütt ◽  
...  
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Current Flow ◽  
Series Resistance ◽  
Electrical Contacts ◽  
New Method ◽  
Contactless Measurement ◽  
Sample Handling ◽  
Imaging Methods ◽  
Lateral Current

Abstract Conventional series resistance imaging methods require electrical contacts for current injection or extraction in order to generate lateral current flow in the solar cell. This paper presents a new method to generate lateral current flow in the solar cell without any electrical contacts. This reduces the sample handling complexity for inline application and allows for measurements on unfinished solar cell precursors.

scholarly journals From 1 Sun to 10 Suns c-Si Cells by Optimizing Metal Grid, Metal Resistance, and Junction Depth

2009 ◽  
Vol 2009 ◽  
pp. 1-11 ◽  
Author(s):  
Vikrant A. Chaudhari ◽  
Chetan S. Solanki
Keyword(s):  
Solar Cell ◽  
Power Loss ◽  
Series Resistance ◽  
Metal Resistance ◽  
Efficiency Gain ◽  
Metal Contacts ◽  
Junction Depth ◽  
Metal Grid ◽  
Grid Optimization ◽  
Optimization Efficiency

Use of a solar cell in concentrator PV technology requires reduction in its series resistance in order to minimize the resistive power losses. The present paper discusses a methodology of reducing the series resistance of a commercial c-Si solar cell for concentrator applications, in the range of 2 to 10 suns. Step by step optimization of commercial cell in terms of grid geometry, junction depth, and electroplating of the front metal contacts is proposed. A model of resistance network of solar cell is developed and used for the optimization. Efficiency of unoptimized commercial cell at 10 suns drops by 30% of its 1 sun value corresponding to resistive power loss of about 42%. The optimized cell with grid optimization, junction optimization, electroplating, and junction optimized with electroplated contacts cell gives resistive power loss of 20%, 16%, 11%, and 8%, respectively. An efficiency gain of 3% at 10 suns for fully optimized cell is estimated.

scholarly journals The impact of silicon solar cell architecture and cell interconnection on energy yield in hot & sunny climates

2017 ◽  
Vol 10 (5) ◽  
pp. 1196-1206 ◽  
Author(s):  
Jan Haschke ◽  
Johannes P. Seif ◽  
Yannick Riesen ◽  
Andrea Tomasi ◽  
Jean Cattin ◽  
...  
Keyword(s):  
Solar Cell ◽  
Silicon Solar Cell ◽  
Series Resistance ◽  
Energy Yield ◽  
Cell Architecture ◽  
The Impact

A series resistance induced by cell interconnections will lead to a worse TCPMPP of solar modules compared with cells.

scholarly journals Series Resistance Analysis of Passivated Emitter Rear Contact Cells Patterned Using Inkjet Printing

2012 ◽  
Vol 2012 ◽  
pp. 1-8 ◽  
Author(s):  
Martha A. T. Lenio ◽  
James Howard ◽  
Doris (Pei Hsuan) Lu ◽  
Fabian Jentschke ◽  
Yael Augarten ◽  
...  
Keyword(s):  
Solar Cell ◽  
Inkjet Printing ◽  
Series Resistance ◽  
Low Cost ◽  
Nickel Plating ◽  
Manufacturing Environment ◽  
Resistance Analysis ◽  
Metal Plating ◽  
Cell Structures ◽  
High Series

For higher-efficiency solar cell structures, such as the Passivated Emitter Rear Contact (PERC) cells, to be fabricated in a manufacturing environment, potentially low-cost techniques such as inkjet printing and metal plating are desirable. A common problem that is experienced when fabricating PERC cells is low fill factors due to high series resistance. This paper identifies and attempts to quantify sources of series resistance in inkjet-patterned PERC cells that employ electroless or light-induced nickel-plating techniques followed by copper light-induced plating. Photoluminescence imaging is used to determine locations of series resistance losses in these inkjet-patterned and plated PERC cells.

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