Hybrid greedy pursuit algorithms for enhancing radar imaging quality

2020 ◽  
pp. 15-42
Keyword(s):  
Radar Imaging ◽  
Imaging Quality

Antireflection Coatings for Semiconductor Failure Analysis

2000 ◽  
Author(s):  
Brennan Davis ◽  
Wilson Chi
Keyword(s):  
Failure Analysis ◽  
Material Properties ◽  
Antireflection Coating ◽  
Antireflection Coatings ◽  
Imaging Quality ◽  
Quality Material

Abstract The use of an antireflection coating for backside semiconductor failure analysis is discussed. The process of selecting an appropriate coating is described. Several known coatings are also described in regards to imaging quality, material properties, and the benefits to device analysis applications.

Multisensor Fusion Processing for Enhanced Radar Imaging

2000 ◽  
Author(s):  
Laura D. Vann ◽  
Kevin M. Cuomo ◽  
Jean E. Piou ◽  
Joseph T. Mayhan
Keyword(s):  
Radar Imaging ◽  
Multisensor Fusion
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