Determination of semiconductor resistivity by microwave measurements

1968 ◽  
Vol 115 (5) ◽  
pp. 742
Author(s):  
A.G. Heaton ◽  
D.K. Pal
1949 ◽  
Vol 76 (9) ◽  
pp. 1419-1419 ◽  
Author(s):  
A. H. Sharbaugh ◽  
J. K. Bragg ◽  
T. C. Madison ◽  
V. G. Thomas

1984 ◽  
Vol 15 (1) ◽  
pp. 1-20 ◽  
Author(s):  
Hsiao-Hua K Burke ◽  
Clinton J Bowley ◽  
James C Barnes

The use of a Fabry–Perot etalon for the study of the pure rotational Raman spectra of oxygen and nitrogen is described. By using an etalon having a plate separation of 12 mm, a resolution of 0.1 cm -1 is readily achieved. The use of a Fabry-Perot etalon allows the wavelength of the individual rotational lines to be measured with high accuracy and leads to precise values for the rotational constants of oxygen and nitrogen. The rotational constants obtained are for N 2 B 0 = 1.98950 6 ±0.00002 7 cm -1 , D 0 = (5.48±0.05 5 ) x 10 -6 cm -1 ; for O 2 B 0 = 1.437682 ±0.000009 cm -1 , D 0 = (4.85 2 ± 0.01 2 ) x 10 -6 cm -1 . The values determined for oxygen are in excellent agreement with recent microwave measurements of these constants.


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