Three-dimensional atomic-scale investigation of defects in semiconductors by atom probe tomography
2019 ◽
pp. 417-450
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Keyword(s):
2017 ◽
Vol 23
(2)
◽
pp. 307-313
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2018 ◽
2012 ◽
Vol 463-464
◽
pp. 20-24
2012 ◽
Vol 19
(1)
◽
pp. 67-71
Keyword(s):
2018 ◽
Vol 24
(4)
◽
pp. 342-349
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