scholarly journals Optimal synthesis of reconfigurable planar arrays for monopulse radar applications: Use of subarrays and distributions with common aperture tail

Author(s):  
Zhengdong Qi ◽  
Xinggan Zhang ◽  
Yechao Bai ◽  
Qiong Wang ◽  
Chunhua Yu ◽  
...  
2010 ◽  
Vol 20 ◽  
pp. 33-48 ◽  
Author(s):  
Andrea Francesco Morabito ◽  
Antonia Rita Lagana ◽  
Tommaso Isernia

Author(s):  
R. Gonzalez ◽  
L. Bru

The analysis of stacking fault tetrahedra (SFT) in fatigued metals (1,2) is somewhat complicated, due partly to their relatively low density, but principally to the presence of a very high density of dislocations which hides them. In order to overcome this second difficulty, we have used in this work an austenitic stainless steel that deforms in a planar mode and, as expected, examination of the substructure revealed planar arrays of dislocation dipoles rather than the cellular structures which appear both in single and polycrystals of cyclically deformed copper and silver. This more uniform distribution of dislocations allows a better identification of the SFT.The samples were fatigue deformed at the constant total strain amplitude Δε = 0.025 for 5 cycles at three temperatures: 85, 293 and 773 K. One of the samples was tensile strained with a total deformation of 3.5%.


PIERS Online ◽  
2005 ◽  
Vol 1 (2) ◽  
pp. 128-132 ◽  
Author(s):  
Habiba Hafdallah Ouslimani ◽  
Redha Abdeddaim ◽  
Alain Priou

2018 ◽  
Vol 50 (001) ◽  
pp. 07-12 ◽  
Author(s):  
S. S. MEMON ◽  
A. A. JAMALI ◽  
M. R. ANJUM ◽  
M. M. MEMON ◽  
S. F. QADRI

Author(s):  
M. Bouya ◽  
D. Carisetti ◽  
J.C. Clement ◽  
N. Malbert ◽  
N. Labat ◽  
...  

Abstract HEMT (High Electron Mobility Transistor) are playing a key role for power and RF low noise applications. They are crucial components for the development of base stations in the telecommunications networks and for civil, defense and space radar applications. As well as the improvement of the MMIC performances, the localization of the defects and the failure analysis of these devices are very challenging. To face these challenges, we have developed a complete approach, without degrading the component, based on front side failure analysis by standard (Visible-NIR) and Infrared (range of wavelength: 3-5 µm) electroluminescence techniques. Its complementarities and efficiency have been demonstrated through two case studies.


2011 ◽  
Vol 33 (6) ◽  
pp. 1471-1474
Author(s):  
Feng Zhang ◽  
Xiao-jun Liu ◽  
Yi-cai Ji ◽  
Guang-you Fang ◽  
Han-ji Ju

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