Analysis of semiconductor laser frequency noise taking into account multiple reflections in the external cavity

2000 ◽  
Vol 147 (5) ◽  
pp. 335-344 ◽  
Author(s):  
A.V.T. Cartaxo ◽  
J.A.P. Morgado
Author(s):  
Miguel Iglesias Olmedo ◽  
Xiaodan Pang ◽  
Molly Piels ◽  
Richard Schatz ◽  
Gunnar Jacobsen ◽  
...  

2015 ◽  
Author(s):  
T. Saito ◽  
K. Kondo ◽  
Y. Tokutake ◽  
S. Maehara ◽  
K. Doi ◽  
...  

1988 ◽  
Vol 24 (11) ◽  
pp. 684-685
Author(s):  
S. Betti ◽  
G. de Marchis ◽  
E. Iannone ◽  
A. Martellucci

1988 ◽  
Vol 24 (16) ◽  
pp. 988 ◽  
Author(s):  
J. Mellis ◽  
S.A. Al-Chalabi ◽  
K.H. Cameron ◽  
R. Wyatt ◽  
J.C. Regnault ◽  
...  

2021 ◽  
Vol 15 (1) ◽  
Author(s):  
Manchao Zhang ◽  
Yi Xie ◽  
Jie Zhang ◽  
Weichen Wang ◽  
Chunwang Wu ◽  
...  

1990 ◽  
Vol 26 (15) ◽  
pp. 1159 ◽  
Author(s):  
S.A. Al-Chalabi ◽  
J. Mellis ◽  
M. Hollier ◽  
K.H. Cameron ◽  
R. Wyatt ◽  
...  

1984 ◽  
Vol 5 (2) ◽  
Author(s):  
C. J. Nielsen ◽  
J. H. Osmundsen

SummaryAn automatic linewidth control loop which provides stable optimum linewidth reduction and single cavity mode operation of an external cavity semiconductor laser is presented. Stable linewidth reduction from 70 MHz to below 2 MHz is obtained for a 1.3 μm BH-laser, whereas simultaneous mean frequency stabilization to within 1 kHz and linewidth reduction from 17 MHz to 1.6 MHz is demonstrated for an 830 nm CSP-laser.


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