scholarly journals Enhancements in mm‐wave antenna measurements: automatic alignment and achievable accuracy

2017 ◽  
Vol 11 (12) ◽  
pp. 1676-1680 ◽  
Author(s):  
Linus Boehm ◽  
Frank Boegelsack ◽  
Martin Hitzler ◽  
Christian Waldschmidt
Keyword(s):  
Wave Antenna ◽  
Automatic Alignment ◽  
Antenna Measurements ◽  
Achievable Accuracy

The Influence of the Probe Connection on mm-Wave Antenna Measurements

2015 ◽  
Vol 63 (9) ◽  
pp. 3819-3825 ◽  
Author(s):  
Ad C. F. Reniers ◽  
A. Rainier van Dommele ◽  
A. Bart Smolders ◽  
Matti H. A. J. Herben
Keyword(s):  
Wave Antenna ◽  
Antenna Measurements

Influence of on-wafer probes in mm-wave antenna measurements

2018 ◽  
Author(s):  
Q. Liu ◽  
A.C.F. Reniers ◽  
U. Johannsen ◽  
M.C. van Beurden ◽  
A.B. Smolders
Keyword(s):  
Wave Antenna ◽  
Antenna Measurements

Computer-Controlled Hrem Alignment Using Automated Diffractogram Analysis

1990 ◽  
Vol 48 (1) ◽  
pp. 532-533
Author(s):  
G.Y. Fan ◽  
O.L. Krivanek
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
The Other ◽  
Full Information ◽  
Resolution Electron ◽  
Skilled Operator ◽  
Automatic Alignment ◽  
High Resolution Electron Microscope ◽  
Computer Controlled ◽  
Recorded Image

Full alignment of a high resolution electron microscope (HREM) requires five parameters to be optimized: the illumination angle (beam tilt) x and y, defocus, and astigmatism magnitude and orientation. Because neither voltage nor current centering lead to the correct illumination angle, all the adjustments must be done on the basis of observing contrast changes in a recorded image. The full alignment can be carried out by a computer which is connected to a suitable image pick-up device and is able to control the microscope, sometimes with greater precision and speed than even a skilled operator can achieve. Two approaches to computer-controlled (automatic) alignment have been investigated. The first is based on measuring the dependence of the overall contrast in the image of a thin amorphous specimen on the relevant parameters, the other on measuring the image shift. Here we report on our progress in developing a new method, which makes use of the full information contained in a computed diffractogram.

Principles of Planar Near-Field Antenna Measurements

2007 ◽  
Author(s):  
Stuart Gregson ◽  
John McCormick ◽  
Clive Parini
Keyword(s):  
Near Field ◽  
Antenna Measurements
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