All-optical envelope detection for wireless photonic communication

2007 ◽  
Author(s):  
I.T. Monroy ◽  
J. Seoane ◽  
P. Jeppesen
Keyword(s):  
Envelope Detection ◽  
All Optical

All-Optical Payload Envelope Detection for Packets with 40 Gbps Payloads and 10 Gbps Labels

2006 ◽  
Author(s):  
Brian R. Koch ◽  
Zhaoyang Hu ◽  
John E. Bowers ◽  
Daniel J. Blumenthal
Keyword(s):  
Envelope Detection ◽  
All Optical

scholarly journals All-optical payload envelope detection for variable length 40-gb/s optically labeled packets

2006 ◽  
Vol 18 (17) ◽  
pp. 1846-1848 ◽  
Author(s):  
B.R. Koch ◽  
Zhaoyang Hu ◽  
J.E. Bowers ◽  
D.J. Blumenthal
Keyword(s):  
Variable Length ◽  
Envelope Detection ◽  
All Optical

On-the-Fly All-Optical Contention Resolution for NRZ and RZ Data Formats Using Packet Envelope Detection and Integrated Optical Switches

2007 ◽  
Vol 19 (8) ◽  
pp. 538-540 ◽  
Author(s):  
L. Stampoulidis ◽  
E. Kehayas ◽  
D. Apostolopoulos ◽  
P. Bakopoulos ◽  
K. Vyrsokinos ◽  
...  
Keyword(s):  
Optical Switches ◽  
Contention Resolution ◽  
Data Formats ◽  
Integrated Optical ◽  
Envelope Detection ◽  
All Optical

scholarly journals All-optical envelope detection for radio-over- fiber links using external optical injection of a DFB laser

2008 ◽  
Vol 16 (3) ◽  
pp. 2005 ◽  
Author(s):  
Kamau Prince ◽  
Idelfonso Tafur Monroy ◽  
Jorge Seoane ◽  
Palle Jeppesen
Keyword(s):  
Radio Over Fiber ◽  
Optical Injection ◽  
Envelope Detection ◽  
All Optical ◽  
Dfb Laser ◽  
Fiber Links

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

Sign in / Sign up

Export Citation Format

Share Document