scholarly journals Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

2001 ◽  
Vol 37 (22) ◽  
pp. 1335 ◽  
Author(s):  
A. Sandhu ◽  
H. Masuda ◽  
K. Kurosawa ◽  
A. Oral ◽  
S.J. Bending
Keyword(s):  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Hall Probe ◽  
Probe Microscopy ◽  
Magnetic Imaging ◽  
Hall Probes ◽  
Temperature Scanning ◽  
Scanning Hall Probe Microscopy ◽  
Focused Ion Beam Milling

scholarly journals Room temperature scanning Hall probe microscopy using GaAs/AlGaAs and Bi micro-hall probes

2002 ◽  
Vol 91 (1-4) ◽  
pp. 97-101 ◽  
Author(s):  
A Sandhu ◽  
H Masuda ◽  
A Oral ◽  
S.J Bending ◽  
A Yamada ◽  
...  
Keyword(s):  
Room Temperature ◽  
Hall Probe ◽  
Probe Microscopy ◽  
Hall Probes ◽  
Temperature Scanning ◽  
Scanning Hall Probe Microscopy

scholarly journals Room Temperature Sub-Micron Magnetic Imaging by Scanning Hall Probe Microscopy

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4321-4324 ◽  
Author(s):  
Adarsh Sandhu ◽  
Hiroshi Masuda ◽  
Ahmet Oral ◽  
Simon J. Bending
Keyword(s):  
Room Temperature ◽  
Hall Probe ◽  
Probe Microscopy ◽  
Magnetic Imaging ◽  
Scanning Hall Probe Microscopy

Second-generation quantum-well sensors for room-temperature scanning Hall probe microscopy

2005 ◽  
Vol 97 (9) ◽  
pp. 096105 ◽  
Author(s):  
A. Pross ◽  
A. I. Crisan ◽  
S. J. Bending ◽  
V. Mosser ◽  
M. Konczykowski
Keyword(s):  
Quantum Well ◽  
Room Temperature ◽  
Second Generation ◽  
Hall Probe ◽  
Probe Microscopy ◽  
Temperature Scanning ◽  
Scanning Hall Probe Microscopy

scholarly journals 50 nm Hall Sensors for Room Temperature Scanning Hall Probe Microscopy

2004 ◽  
Vol 43 (2) ◽  
pp. 777-778 ◽  
Author(s):  
Adarsh Sandhu ◽  
Kouichi Kurosawa ◽  
Munir Dede ◽  
Ahmet Oral
Keyword(s):  
Room Temperature ◽  
Hall Probe ◽  
Probe Microscopy ◽  
Temperature Scanning ◽  
Hall Sensors ◽  
Scanning Hall Probe Microscopy

scholarly journals Magnetic Imaging on the Nanometer Scale Using Low-Temperature Scanning Probe Techniques

2011 ◽  
Vol 19 (6) ◽  
pp. 34-38 ◽  
Author(s):  
M. Zech ◽  
C. Boedefeld ◽  
F. Otto ◽  
D. Andres
Keyword(s):  
Data Storage ◽  
Ease Of Use ◽  
Scanning Probe ◽  
Magnetic Data ◽  
Hall Probe ◽  
Probe Microscopy ◽  
Lorentz Microscopy ◽  
Magnetic Imaging ◽  
Temperature Scanning ◽  
Scanning Hall Probe Microscopy

Multiple techniques now exist for the investigation of nanoscale magnetic properties, extending from Lorentz microscopy and magneto-optical imaging (MOKE) to scanning probe microscopy approaches (see Figure 1 for an overview). Among the latter, the most widely used techniques offering both high spatial and high magnetic-field resolution are magnetic force microscopy (MFM) and scanning Hall probe microscopy (SHPM). Both techniques are well known for their versatility and ease of use and can be further adapted for operation in cryogenic conditions. This property is crucial for all areas of research where high magnetic fields are required and where the influence of thermal energy/broadening needs to be suppressed. For example, much of today's fundamental research on superconductivity, spintronics, and magnetic data storage is taking place at low temperatures.

scholarly journals Room Temperature Scanning Hall Probe Microscopy in External Fields.

2001 ◽  
Vol 25 (4−2) ◽  
pp. 1063-1066 ◽  
Author(s):  
Adarsh Sandhu ◽  
Hiroshi Masuda ◽  
Ahmet Oral ◽  
Simon. J. Bending
Keyword(s):  
Room Temperature ◽  
Hall Probe ◽  
External Fields ◽  
Probe Microscopy ◽  
Temperature Scanning ◽  
Scanning Hall Probe Microscopy
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