New defect size distribution function for estimation of chip critical area in integrated circuit yield models
1990 ◽
Vol 98
(1136)
◽
pp. 389-395
◽
1977 ◽
Vol 38
(C2)
◽
pp. C2-185-C2-190
◽
1996 ◽
Vol 87
(6)
◽
pp. 508-512
2018 ◽
Vol 52
(1)
◽
pp. 015101
◽
2013 ◽