Electrical loss mechanisms in travelling wave LiNbO3 optical modulators

1992 ◽  
Vol 28 (2) ◽  
pp. 207 ◽  
Author(s):  
G.K. Gopalakrishnan ◽  
W.K. Burns ◽  
C.H. Bulmer
Keyword(s):  
Travelling Wave ◽  
Optical Modulators ◽  
Electrical Loss ◽  
Loss Mechanisms

Loss mechanisms of travelling wave direct energy converters for D-3He FRC fusion reactors

2000 ◽  
Vol 51-52 ◽  
pp. 339-344 ◽  
Author(s):  
M Ishikawa ◽  
T Yamane ◽  
Y Shimizu ◽  
H Momota ◽  
Y Tomita ◽  
...  
Keyword(s):  
Travelling Wave ◽  
Fusion Reactors ◽  
Direct Energy ◽  
Loss Mechanisms ◽  
Energy Converters

New polarized-light microscope for fast and orientation independent measurement of birefringent fine structure

1993 ◽  
Vol 51 ◽  
pp. 82-83
Author(s):  
Rudolf Oldenbourg
Keyword(s):  
Light Microscope ◽  
Polarized Light ◽  
Video Camera ◽  
Limited Range ◽  
Image Point ◽  
Computer Assisted ◽  
Optical Modulators ◽  
Anisotropic Structures ◽  
Long Time ◽  
Computer Assisted Image

The polarized light microscope has the unique potential to measure submicroscopic molecular arrangements dynamically and non-destructively in living cells and other specimens. With the traditional pol-scope, however, single images display only those anisotropic structures that have a limited range of orientations with respect to the polarization axes of the microscope. Furthermore, rapid measurements are restricted to a single image point or single area that exhibits uniform birefringence or other form of optical anisotropy, while measurements comparing several image points take an inordinately long time.We are developing a new kind of polarized light microscope which combines speed and high resolution in its measurement of the specimen anisotropy, irrespective of its orientation. The design of the new pol-scope is based on the traditional polarized light microscope with two essential modifications: circular polarizers replace linear polarizers and two electro-optical modulators replace the traditional compensator. A video camera and computer assisted image analysis provide measurements of specimen anisotropy in rapid succession for all points of the image comprising the field of view.

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