Using cold FET to check accuracy of microwave noise parameter test set

1991 ◽  
Vol 27 (10) ◽  
pp. 833-835 ◽  
Author(s):  
L. Escotte ◽  
R. Plana ◽  
J. Rayssac ◽  
O. Llopis ◽  
J. Graffeuil
2008 ◽  
Vol 57 (11) ◽  
pp. 2462-2471 ◽  
Author(s):  
Chih-Hung Chen ◽  
Ying-Lien Wang ◽  
M.H. Bakr ◽  
Zheng Zeng

2001 ◽  
Vol 48 (11) ◽  
pp. 2568-2574 ◽  
Author(s):  
G. Niu ◽  
J.D. Cressler ◽  
Shiming Zhang ◽  
W.E. Ansley ◽  
C.S. Webster ◽  
...  

Author(s):  
A.H. Regan ◽  
C.D. Ziomek ◽  
T.R. Brooks
Keyword(s):  
Test Set ◽  

1991 ◽  
Vol 27 (2) ◽  
pp. 3289-3292 ◽  
Author(s):  
J.M. O'Callaghan ◽  
J.S. Martens ◽  
J.H. Thompson ◽  
J.B. Beyer ◽  
J.E. Nordman

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