Refractive index profile measurement of compound thin films by ellipsometry

1989 ◽  
Vol 25 (16) ◽  
pp. 1084 ◽  
Author(s):  
J.H. Ho ◽  
C.L. Lee ◽  
T.F. Lei
2006 ◽  
Vol 88 (11) ◽  
pp. 111114 ◽  
Author(s):  
M. de Angelis ◽  
S. De Nicola ◽  
A. Finizio ◽  
G. Pierattini ◽  
P. Ferraro ◽  
...  

1994 ◽  
Vol 7 (18) ◽  
pp. 821-823 ◽  
Author(s):  
Kamal K. Das ◽  
Muhammad Arif ◽  
A. F. M. Yusuf Halder ◽  
Mohammad S. Alam

Sign in / Sign up

Export Citation Format

Share Document