Radial gradient refractive-index glass rods prepared by a sol–gel method

1986 ◽  
Vol 22 (2) ◽  
pp. 99 ◽  
Author(s):  
K. Shingyouchi ◽  
S. Konishi ◽  
K. Susa ◽  
I. Matsuyama
Keyword(s):  
Refractive Index ◽  
Sol Gel ◽  
Gel Method ◽  
Sol Gel Method ◽  
Radial Gradient ◽  
Gradient Refractive Index ◽  
Glass Rods

scholarly journals Study of TiO2, SnO2 and nanocomposites TiO2:SnO2 thin films prepared by sol-gel method: Successful elaboration of variable–refractive index systems

2020 ◽  
Vol 7 (1) ◽  
pp. 016439 ◽  
Author(s):  
F Medjaldi ◽  
A Bouabellou ◽  
Y Bouachiba ◽  
A Taabouche ◽  
K Bouatia ◽  
...  
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Sol Gel ◽  
Gel Method ◽  
Sol Gel Method ◽  
Sno2 Thin Films ◽  
Index Systems

r-GRIN TiO2-SiO2 glass rods prepared by a sol-gel method

1986 ◽  
Vol 22 (21) ◽  
pp. 1108 ◽  
Author(s):  
K. Shingyouchi ◽  
S. Konishi ◽  
K. Susa ◽  
I. Matsuyama
Keyword(s):  
Sol Gel ◽  
Sio2 Glass ◽  
Gel Method ◽  
Sol Gel Method ◽  
Glass Rods

Structure of Thin Sol-Gel Coatings Near The Surface of Substrates

1992 ◽  
Vol 271 ◽  
Author(s):  
Hiroshi Hirashima ◽  
Takao Kusaka
Keyword(s):  
Refractive Index ◽  
Silica Glass ◽  
Sol Gel ◽  
Dip Coating ◽  
Oxide Coatings ◽  
Gel Method ◽  
Sol Gel Method ◽  
Glass Substrates ◽  
Interface Dynamic ◽  
Glass Plates

ABSTRUCTThe sol-gel method is one of the most appropriate technologies for the preparation of functional thin oxide coatings. However, few studies on the structure near the interface between sol-gel coatings and substrates have been reported. In this study, the structures of thin TiO2 gel coatings were investigated by XPS in order to elucidate the interaction between the coatings and the glass substrates. TiO2 gel coatings were prepared from Ti-alkoxide by hydrolysis and dip-coating on silica glass plates. Thickness and refractive index measurements were made by ellipsometry. Changes in Ols spectra for the coatings were observed at locations near the interface. Dynamic microhardness measurements for the coatings and the coated glasses were made. These results suggest the formation of a Ti-O-Si bond at the interface.

Structure Property of Titanium Dioxide Thin Films in Sintered Temperature by the Sol-Gel Method

2008 ◽  
Vol 368-372 ◽  
pp. 1465-1467
Author(s):  
Chien Jung Huang ◽  
Kuo Chien Liao ◽  
Yan Kuin Su
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Titanium Dioxide ◽  
Tio2 Film ◽  
Tio2 Thin Film ◽  
Sol Gel ◽  
Refraction Index ◽  
Structure Property ◽  
Gel Method ◽  
Sol Gel Method

Titanium dioxide (TiO2) thin film on glass substrate is fabricated by sol-gel method. The TiO2 film is sintered at various temperatures for investigation on the refraction index and crystallization characteristic. The lower refractive index of the TiO2 thin film is 1.89 when the sintering is performed at the low temperature of 200°C and the thickness is 448 nm. However, the higher refractive index of 2.55 and chemical stability of the TiO2 film in rutile phase are obtained via sintering temperature at 700°C.

r-GRIN glass rods prepared by a sol-gel method

1988 ◽  
Vol 100 (1-3) ◽  
pp. 511-513 ◽  
Author(s):  
S. Konishi ◽  
K. Shingyouchi ◽  
A. Makishima
Keyword(s):  
Sol Gel ◽  
Gel Method ◽  
Sol Gel Method ◽  
Glass Rods

scholarly journals High Refractive Index Silica-Titania Films Fabricated via the Sol–Gel Method and Dip-Coating Technique—Physical and Chemical Characterization

Materials ◽  
2021 ◽  
Vol 14 (23) ◽  
pp. 7125
Author(s):  
Magdalena Zięba ◽  
Katarzyna Wojtasik ◽  
Cuma Tyszkiewicz ◽  
Ewa Gondek ◽  
Jacek Nizioł ◽  
...  
Keyword(s):  
Refractive Index ◽  
Sol Gel ◽  
Composite Films ◽  
Dip Coating ◽  
Root Mean Square Roughness ◽  
Soda Lime Glass ◽  
Gel Method ◽  
Sol Gel Method ◽  
Coating Technique ◽  
Dip Coating Technique

Crack-free binary SiOx:TiOy composite films with the refractive index of ~1.94 at wavelength 632.8 nm were fabricated on soda-lime glass substrates, using the sol–gel method and dip-coating technique. With the use of transmission spectrophotometry and Tauc method, the energy of the optical band gap of 3.6 eV and 4.0 eV were determined for indirect and direct optical allowed transitions, respectively. Using the reflectance spectrophotometry method, optical homogeneity of SiOx:TiOy composite films was confirmed. The complex refractive index determined by spectroscopic ellipsometry confirmed good transmission properties of the developed SiOx:TiOy films in the Vis-NIR spectral range. The surface morphology of the SiOx:TiOy films by atomic force microscopy (AFM) and scanning electron microscopy (SEM) methods demonstrated their high smoothness, with the root mean square roughness at the level of ~0.15 nm. Fourier-transform infrared (FTIR) spectroscopy and Raman spectroscopy were used to investigate the chemical properties of the SiOx:TiOy material. The developed binary composite films SiOx:TiOy demonstrate good waveguide properties, for which optical losses of 1.1 dB/cm and 2.7 dB/cm were determined, for fundamental TM0 and TE0 modes, respectively.

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