Determination of spatial surface state density distribution in MOS and SIMOS transistors after channel hot electron injection

H.E. Maes; G. Groeseneken

doi:10.1049/el:19820255

Determination of spatial surface state density distribution in MOS and SIMOS transistors after channel hot electron injection

Electronics Letters ◽

10.1049/el:19820255 ◽

1982 ◽

Vol 18 (9) ◽

pp. 372 ◽

Cited By ~ 40

Author(s):

H.E. Maes ◽

G. Groeseneken

Keyword(s):

Density Distribution ◽

Surface State ◽

Electron Injection ◽

State Density ◽

Hot Electron ◽

Surface State Density ◽

Hot Electron Injection

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Determination of InP surface state density distribution from excitation-power-dependent photoluminescence spectra using genetic algorithm-based fitting procedure

Surface Science ◽

10.1016/s0039-6028(02)01253-0 ◽

2002 ◽

Vol 507-510 ◽

pp. 240-244 ◽

Cited By ~ 3

Author(s):

M. Miczek ◽

B. Adamowicz ◽

H. Hasegawa

Keyword(s):

Genetic Algorithm ◽

Density Distribution ◽

Surface State ◽

Excitation Power ◽

State Density ◽

Photoluminescence Spectra ◽

Surface State Density ◽

Fitting Procedure ◽

Inp Surface

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ChemInform Abstract: DETERMINATION OF SURFACE STATE DENSITY ON N-GALLIUM ARSENIDE AND N-GALLIUM PHOSPHIDE IN AQUEOUS ELECTROLYTES BY CAPACITANCE MEASUREMENTS

Chemischer Informationsdienst ◽

10.1002/chin.198001008 ◽

1980 ◽

Vol 11 (1) ◽

Author(s):

R. WEICHE ◽

J. WESTFAHL ◽

P. JANIETZ ◽

R. DEHMLOW

Keyword(s):

Gallium Arsenide ◽

Surface State ◽

Gallium Phosphide ◽

State Density ◽

Aqueous Electrolytes ◽

Capacitance Measurements ◽

Surface State Density

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Modification of Surface State Density Distribution of p-InP Surfaces by Nitrogen Radical Exposure

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.070209 ◽

2011 ◽

Vol 50 (7) ◽

pp. 070209 ◽

Cited By ~ 1

Author(s):

Toshiyuki Yoshida ◽

Tamotsu Hashizume

Keyword(s):

Density Distribution ◽

Surface State ◽

State Density ◽

Surface State Density ◽

Nitrogen Radical

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Surface state density distribution at an Al2O3‐InP metal‐insulator‐semiconductor field‐effect transistor measured by the charge pumping technique

Applied Physics Letters ◽

10.1063/1.97612 ◽

1986 ◽

Vol 49 (6) ◽

pp. 351-353 ◽

Cited By ~ 5

Author(s):

Takeshi Kobayashi ◽

Tohru Ichikawa ◽

Tetsurou Sawai

Keyword(s):

Density Distribution ◽

Surface State ◽

Field Effect ◽

Field Effect Transistor ◽

State Density ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Charge Pumping ◽

Surface State Density ◽

Effect Transistor

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Determination of Interface State Density Distribution and Surface Recombination Velocity on Passivated Semiconductor Surfaces by Photoluminescence Surface State Spectroscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.185-188.53 ◽

1995 ◽

Vol 185-188 ◽

pp. 53-58

Author(s):

T. Saitoh ◽

Hisashi Hasegawa

Keyword(s):

Density Distribution ◽

Surface State ◽

Surface Recombination ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Surface Recombination Velocity ◽

Semiconductor Surfaces ◽

Recombination Velocity

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Surface state density distribution of semiconducting diamond films measured from the Al/CaF2/i-diamond metal-insulator-semiconductor diodes and transistors

Journal of Applied Physics ◽

10.1063/1.365658 ◽

1997 ◽

Vol 82 (7) ◽

pp. 3422-3429 ◽

Cited By ~ 32

Author(s):

Young Yun ◽

Tetsuro Maki ◽

Takeshi Kobayashi

Keyword(s):

Density Distribution ◽

Surface State ◽

Diamond Films ◽

State Density ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Surface State Density ◽

Semiconducting Diamond

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Surface state density distribution at vacuum-annealed InP(100) surface as derived from the rigorous analysis of photoluminescence efficiency

Applied Surface Science ◽

10.1016/j.apsusc.2008.03.020 ◽

2008 ◽

Vol 254 (24) ◽

pp. 8046-8049 ◽

Cited By ~ 4

Author(s):

P. Tomkiewicz ◽

B. Adamowicz ◽

M. Miczek ◽

H. Hasegawa ◽

J. Szuber

Keyword(s):

Density Distribution ◽

Surface State ◽

State Density ◽

Rigorous Analysis ◽

Surface State Density ◽

Photoluminescence Efficiency

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Determination of surface state density from gm − VG characteristics of MOSFETs

Solid-State Electronics ◽

10.1016/0038-1101(78)90278-2 ◽

1978 ◽

Vol 21 (2) ◽

pp. 459-463 ◽

Cited By ~ 2

Author(s):

H. Katto ◽

S. Muramatsu

Keyword(s):

Surface State ◽

State Density ◽

Surface State Density

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Determination of surface state density for GaAs and InAlAs by room temperature photoreflectance

Journal of Applied Physics ◽

10.1063/1.370961 ◽

1999 ◽

Vol 86 (3) ◽

pp. 1765-1767 ◽

Cited By ~ 25

Author(s):

G. S. Chang ◽

W. C. Hwang ◽

Y. C. Wang ◽

Z. P. Yang ◽

J. S. Hwang

Keyword(s):

Surface State ◽

Room Temperature ◽

State Density ◽

Surface State Density

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Determination of surface state density from characteristics of MOSFETs

Microelectronics Reliability ◽

10.1016/0026-2714(78)90413-4 ◽

1978 ◽

Vol 17 (6) ◽

pp. 566

Keyword(s):

Surface State ◽

State Density ◽

Surface State Density

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