High frequency microstrip branch-line coupler design with T-junction discontinuity compensation

1981 ◽  
Vol 17 (2) ◽  
pp. 87 ◽  
Author(s):  
M. Cuhaci ◽  
G.J.P. Lo
Keyword(s):  
High Frequency ◽  
Branch Line

scholarly journals A quad-band branch line coupler with high frequency ratio

2021 ◽  
Author(s):  
Guoan Wu ◽  
Shihao Qi ◽  
Wenguang Li ◽  
Baoquan Hu ◽  
Lamin Zhan
Keyword(s):  
High Frequency ◽  
Frequency Ratio ◽  
Branch Line

scholarly journals 5G planar branch line coupler design based on the analysis of dielectric constant, loss tangent and quality factor at high frequency

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Nor Azimah Mohd Shukor ◽  
Norhudah Seman
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Quality Factor ◽  
Loss Tangent ◽  
High Frequency ◽  
Q Factor ◽  
Bandwidth Enhancement ◽  
Branch Line ◽  
Fifth Generation ◽  
Quality Factor Q

Abstract This study focuses on the effect of different dielectric properties in the design of 3-dB planar branch line coupler (BLC) using RT5880, RO4350, TMM4 and RT6010, particularly at high frequency of 26 GHz, the fifth generation (5G) operating frequency. The analysis conducted in this study is based on the dielectric constant, loss tangent and quality factor (Q-factor) associated with the dielectric properties of the substrate materials. Accordingly, the substrate that displayed the best performance for high frequency application had the lowest dielectric constant, lowest loss tangent and highest Q-factor (i.e., RT5880), and it was chosen to enhance our proposed 3-dB BLC. This enhanced 3-dB BLC was designed with the inclusion of microstrip-slot stub impedance at each port for bandwidth enhancement, and the proposed prototype had dimensions of 29.9 mm × 19.9 mm. The design and analysis of the proposed 3-dB BLC were accomplished by employing CST Microwave Studio. The performance of scattering parameters and the phase difference of the proposed BLC were then assessed and verified through laboratory measurement.

scholarly journals Design of a Multiband Antenna for LTE/GSM/UMTS Band Operation

2014 ◽  
Vol 2014 ◽  
pp. 1-9 ◽  
Author(s):  
Youngtaek Hong ◽  
Jinpil Tak ◽  
Jisoo Baek ◽  
Bongsik Myeong ◽  
Jaehoon Choi
Keyword(s):  
Frequency Band ◽  
High Frequency ◽  
Return Loss ◽  
Low Frequency ◽  
Loop Antenna ◽  
High Frequency Band ◽  
Wide Bandwidth ◽  
Branch Line ◽  
Multiband Antenna ◽  
Additional Branch

This paper proposes a multiband antenna for LTE/GSM/UMTS band operation. The proposed antenna consists of a meandered planar inverted-F antenna with an additional branch line for wide bandwidth and a folded-loop antenna. The antenna provides a wide bandwidth to cover the hepta-band LTE/GSM/UMTS operation. The measured 6 dB return loss bandwidth is 169 MHz (793–962 MHz) at the low-frequency band and 1030 MHz (1700–2730 MHz) at the high-frequency band. The overall dimension of the proposed antenna is 55 mm × 110 mm × 5 mm.

The Microstructure of Steatite (Protoenstatite)

1985 ◽  
Vol 43 ◽  
pp. 236-237
Author(s):  
W. E. Lee ◽  
A. H. Heuer
Keyword(s):  
High Frequency ◽  
Glass Ceramics ◽  
Magnesium Silicate ◽  
Beam Current ◽  
Glassy Matrix ◽  
Angle Of Incidence ◽  
X Ray ◽  
Mechanical And Electrical Properties ◽  
Argon Ions ◽  
High Temperature Polymorph

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

Real Ear Sound Pressure Levels Developed by Three Portable Stereo System Earphones

1992 ◽  
Vol 1 (4) ◽  
pp. 52-55 ◽  
Author(s):  
Gail L. MacLean ◽  
Andrew Stuart ◽  
Robert Stenstrom
Keyword(s):  
High Frequency ◽  
Sound Pressure ◽  
Low Frequency ◽  
Test System ◽  
Output Frequency ◽  
Frequency Effects ◽  
Adult Men ◽  
Frequency Responses ◽  
Significant Difference ◽  
Sound Pressure Levels

Differences in real ear sound pressure levels (SPLs) with three portable stereo system (PSS) earphones (supraaural [Sony Model MDR-44], semiaural [Sony Model MDR-A15L], and insert [Sony Model MDR-E225]) were investigated. Twelve adult men served as subjects. Frequency response, high frequency average (HFA) output, peak output, peak output frequency, and overall RMS output for each PSS earphone were obtained with a probe tube microphone system (Fonix 6500 Hearing Aid Test System). Results indicated a significant difference in mean RMS outputs with nonsignificant differences in mean HFA outputs, peak outputs, and peak output frequencies among PSS earphones. Differences in mean overall RMS outputs were attributed to differences in low-frequency effects that were observed among the frequency responses of the three PSS earphones. It is suggested that one cannot assume equivalent real ear SPLs, with equivalent inputs, among different styles of PSS earphones.

Auditory Gating and Extended High-Frequency Thresholds in Normal-Hearing Adults With Minimal Tinnitus

2019 ◽  
Vol 28 (1S) ◽  
pp. 209-224 ◽  
Author(s):  
Julia Campbell ◽  
Alison LaBrec ◽  
Connor Bean ◽  
Mashhood Nielsen ◽  
Won So
Keyword(s):  
High Frequency ◽  
Normal Hearing ◽  
Auditory Gating

Reliability of the Minimum Masking Level as Outcome Variable in Tinnitus Clinical Research

2020 ◽  
Vol 29 (3) ◽  
pp. 429-435
Author(s):  
Patricia C. Mancini ◽  
Richard S. Tyler ◽  
Hyung Jin Jun ◽  
Tang-Chuan Wang ◽  
Helena Ji ◽  
...  
Keyword(s):  
Standard Deviation ◽  
High Frequency ◽  
Pearson Correlation ◽  
Correlation Coefficients ◽  
Outcome Variable ◽  
Reliable Estimate ◽  
Moderate Correlation ◽  
Trained Subjects ◽  
The Relationship ◽  
Minimum Intensity

Purpose The minimum masking level (MML) is the minimum intensity of a stimulus required to just totally mask the tinnitus. Treatments aimed at reducing the tinnitus itself should attempt to measure the magnitude of the tinnitus. The objective of this study was to evaluate the reliability of the MML. Method Sample consisted of 59 tinnitus patients who reported stable tinnitus. We obtained MML measures on two visits, separated by about 2–3 weeks. We used two noise types: speech-shaped noise and high-frequency emphasis noise. We also investigated the relationship between the MML and tinnitus loudness estimates and the Tinnitus Handicap Questionnaire (THQ). Results There were differences across the different noise types. The within-session standard deviation averaged across subjects varied between 1.3 and 1.8 dB. Across the two sessions, the Pearson correlation coefficients, range was r = .84. There was a weak relationship between the dB SL MML and loudness, and between the MML and the THQ. A moderate correlation ( r = .44) was found between the THQ and loudness estimates. Conclusions We conclude that the dB SL MML can be a reliable estimate of tinnitus magnitude, with expected standard deviations in trained subjects of about 1.5 dB. It appears that the dB SL MML and loudness estimates are not closely related.

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