High-frequency tunnel-diode oscillations using a new parallel-strip point-contact diode mount

1965 ◽  
Vol 1 (3) ◽  
pp. 75 ◽  
Author(s):  
M. Gerdine ◽  
F.S. Barnes
Keyword(s):  
High Frequency ◽  
Point Contact ◽  
Tunnel Diode ◽  
Parallel Strip ◽  
Point Contact Diode

Asperity Interactions In EHD Contacts

1978 ◽  
Vol 100 (2) ◽  
pp. 246-252 ◽  
Author(s):  
H. S. Nagaraj ◽  
D. M. Sanborn ◽  
W. O. Winer
Keyword(s):  
Frequency Domain ◽  
High Frequency ◽  
Narrow Band ◽  
Point Contact ◽  
Surface Profile ◽  
Frequency Component ◽  
Interaction Process ◽  
Contact Temperature ◽  
High Frequency Component ◽  
Before And After

Infrared temperature measurements, ferrographic analysis, and surface profilimetry were used to monitor asperity interactions in a sliding EHD point contact. The contact temperature and surface profile signals obtained both before and after a run-in period are compared in the frequency domain by means of a Fourier analyzer. The interaction of surface asperities is accompanied by the presence of a high frequency component in the infrared signal. It is also shown that only a relatively narrow band of wavelengths of the surface profile spectrum are relevant in the interaction process.

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