On-line voltage and dynamic security assessments and control: recent developments and some future directions (Abstract only)

2006 ◽  
Author(s):  
Hsiao-Dong Chiang
Keyword(s):  
Future Directions ◽  
Line Voltage ◽  
Dynamic Security ◽  
Recent Developments ◽  
On Line ◽  
And Control

On-line voltage security assessment and control

2014 ◽  
Vol 24 (11) ◽  
pp. 1618-1631 ◽  
Author(s):  
Hua Li ◽  
Enamul Haq ◽  
Khaled Abdul-Rahman ◽  
Jun Wu ◽  
Patrick Causgrove
Keyword(s):  
Security Assessment ◽  
Line Voltage ◽  
Voltage Security ◽  
On Line ◽  
And Control

Implementation aspects of intelligent machining

2003 ◽  
Vol 217 (5) ◽  
pp. 601-613 ◽  
Author(s):  
Z Katz ◽  
T van Niekerk
Keyword(s):  
Digital Signal ◽  
Integrated Approach ◽  
Indirect Measurement ◽  
Machining Parameters ◽  
Reconfigurable Manufacturing ◽  
Intelligent Machining ◽  
Recent Developments ◽  
On Line ◽  
Wear Monitoring ◽  
And Control

Intelligent machining is an advanced method in manufacturing, related to the recent developments in reconfigurable manufacturing equipment. A multilevel modular scheme for implementing integrated process monitoring, diagnosis and control is proposed. A PC-based hardware integrated within an object-based software structure is used to manipulate several machining parameters while performing on-line sensing of machining variables, through sampling and processing by means of digital signal processing (DSP). Indirect measurement of machining parameters, surface finish and tool wear monitoring, through the use of neurofuzzy (NF) sensor fusion modelling, is presented as a part of the integrated approach. A fuzzy relation (FR), indicating the nature of the connection between dependent and independent process-related variables, and acting as a knowledge node within a decision-making scheme, determines intelligently the variations in machining parameters when a performance parameter exceeds the predetermined functional limits. Such capability is utilized on-line. The integrated approach for further improvement in machining quality and overall productivity is described.

On-Line Analytical Instrumentation in the Water Industry — Problems and Practical Solutions

1983 ◽  
Vol 16 (3) ◽  
pp. 94-97
Author(s):  
R. Briggs
Keyword(s):  
Water Industry ◽  
System Technology ◽  
New Horizons ◽  
The Us ◽  
Recent Developments ◽  
On Line ◽  
Analytical Instrumentation ◽  
The Uk ◽  
And Control ◽  
Industry Needs

Water industry needs in instrumentation and control have been discussed mainly against a background of developments in the UK, in Europe and the US, although requirements in developing areas, where different, have not been ignored. Limitations of existing instrumentation, control and automation (ICA) systems have been discussed, and so too have potential improvements resulting from recent developments in sensor and system technology including developments in microelectronics and microcomputers. Certain sensor and system developments of particular relevance have been discussed in more detail, and so too have certain organisational and logistical aspects. Finally, some new horizons have been explored.

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

Recent developments in automated Transmission Electron MI

1989 ◽  
Vol 47 ◽  
pp. 46-47
Author(s):  
W.J. de Ruijter ◽  
P. Rez ◽  
David J. Smith
Keyword(s):  
Image Analysis ◽  
Computer Image ◽  
Lens Design ◽  
Computer Image Analysis ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Recent Developments ◽  
On Line ◽  
Routine Procedures ◽  
Near Future

There is growing interest in the on-line use of computers in high-resolution electron n which should reduce the demands on highly skilled operators and thereby extend the r of the technique. An on-line computer could obviously perform routine procedures hand, or else facilitate automation of various restoration, reconstruction and enhan These techniques are slow and cumbersome at present because of the need for cai micrographs and off-line processing. In low resolution microscopy (most biologic; primary incentive for automation and computer image analysis is to create a instrument, with standard programmed procedures. In HREM (materials researc computer image analysis should lead to better utilization of the microscope. Instru (improved lens design and higher accelerating voltages) have improved the interpretab the level of atomic dimensions (approximately 1.6 Å) and instrumental resolutior should become feasible in the near future.

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