Live Line Snow and Ice Coverage Detection of Ceramic Insulator Using Gabor Image Features

2017 ◽  
Author(s):  
D. Pernebayeva ◽  
A. James ◽  
M. Bagheri
Keyword(s):  
Image Features ◽  
Ice Coverage ◽  
Ceramic Insulator ◽  
Snow And Ice

Visualising cryospheric images in a virtual environment: present challenges and future implications

Polar Record ◽  
2007 ◽  
Vol 43 (4) ◽  
pp. 305-310 ◽  
Author(s):  
Lisa M. Ballagh ◽  
Mark A. Parsons ◽  
Ross Swick
Keyword(s):  
The United States ◽  
Google Earth ◽  
Sea Ice Concentration ◽  
Ice Coverage ◽  
The Earth ◽  
Current Perspective ◽  
Ice Concentration ◽  
Microwave Imager ◽  
Image Format ◽  
Snow And Ice

ABSTRACTThe United States National Snow and Ice Data Center (NSIDC) initiated an outreach project to enhance the visibility of and interest in cryospheric images. Methods were utilised to convert cryospheric data into a projection and image format compatible with Google Earth™. The word ‘image’ should be emphasised since raster data in a native polar projection and format cannot be overlaid on the Earth without prior data conversions. The project focused on reaching out to a diverse audience by integrating images from key components of the cryosphere into a single compressed Keyhole Markup Language (KMZ) file. As a result, users can visualise glacier photographs, permafrost type and extent, sea ice concentration and extent, and snow extent superimposed on the Earth. Those interested in browsing the NSIDC collection of over 3,000 glacier photographs have the option of zooming into Alaska for a majority of the images and accessing both the photograph and the associated metadata. For a current perspective of global snow and ice coverage, one could look at satellite imagery derived from passive microwave Special Sensor Microwave/Imager (SSM/I) data. Another option is to select the permafrost layer and observe the various types and extent of permafrost. This paper explores the project by describing the data, methodologies and results and concludes with future implications on how to improve the processing and functionality of polar data in Google Earth.

scholarly journals The influence of snow and ice coverage on the energy generation from photovoltaic solar cells

Solar Energy ◽  
2018 ◽  
Vol 159 ◽  
pp. 318-328 ◽  
Author(s):  
Erlend Andenæs ◽  
Bjørn Petter Jelle ◽  
Kristin Ramlo ◽  
Tore Kolås ◽  
Josefine Selj ◽  
...  
Keyword(s):  
Solar Cells ◽  
Energy Generation ◽  
Ice Coverage ◽  
Photovoltaic Solar Cells ◽  
Snow And Ice

A Toolkit for Snow-Cover Area Calculation and Display Based on the Interactive Multisensor Snow and Ice Mapping System and an Example for the Tibetan Plateau Region

2018 ◽  
Vol 10 (01) ◽  
pp. 1850003
Author(s):  
Tyler C. Tucker ◽  
Samuel S. P. Shen
Keyword(s):  
Time Series ◽  
Tibetan Plateau ◽  
Snow Cover ◽  
Temporal Variations ◽  
The Tibetan Plateau ◽  
Plateau Region ◽  
Snow Cover Area ◽  
Ice Coverage ◽  
Mapping System ◽  
Snow And Ice

This research develops a toolkit for snow-cover area calculation and display (SACD) based on the Interactive Multisensor Snow and Ice Mapping System (IMS). The paper uses the Tibetan Plateau region as an example to describe the toolkit’s method, results, and usage. The National Snow and Ice Data Center (NSIDC) provides to the public IMS a well-used system for monitoring the snow and ice cover. The newly developed toolkit is based on a simple shoe-lace formula for a grid box area on a sphere and can be conveniently used to calculate the total area of snow cover given the IMS data. The toolkit has been made available as an open source Python software on GitHub. The toolkit generates the time series of the daily snow-covered area for any region over the Northern Hemisphere from 4 February 1997. The toolkit also creates maps showing snow and ice coverage with an elevation background. The Tibetan Plateau (TP) region [Formula: see text]–[Formula: see text]N)[Formula: see text][Formula: see text]–[Formula: see text]E) is used as an example to demonstrate our work on SACD. The IMS products at 24, 4, and 1[Formula: see text]km resolutions include each grid’s latitude and longitude coordinates that are used to calculate the grid box’s area using the shoe-lace formula. The total TP area calculated by the sum of the areas of all the grid boxes approximates the true spherical TP surface area bounded by [Formula: see text]–[Formula: see text]N) [Formula: see text]–[Formula: see text]E) with a difference 0.046% for the 24[Formula: see text]km grid and 0.033% for the 4[Formula: see text]km grid. The differences in the snow-cover area reported by the 24[Formula: see text]km and 4[Formula: see text]km grids vary between [Formula: see text]% and 6.24%. The temporal variations of the daily TP snow cover are displayed in time series from 4 February 1997 to present with 4[Formula: see text]km and 24[Formula: see text]km resolutions.

7-beam lattice images of (110) oriented Ge

1978 ◽  
Vol 36 (1) ◽  
pp. 290-291
Author(s):  
J.R. Parsons ◽  
C.W. Hoelke
Keyword(s):  
Image Features ◽  
Objective Lens ◽  
Lattice Plane ◽  
Lattice Image ◽  
Crystalline Defects ◽  
Transmission Electron ◽  
Lattice Images ◽  
Electron Microscopes ◽  
Structural Aspects ◽  
Beam Lattice

The direct imaging of a crystal lattice has intrigued electron microscopists for many years. What is of interest, of course, is the way in which defects perturb their atomic regularity. There are problems, however, when one wishes to relate aperiodic image features to structural aspects of crystalline defects. If the defect is inclined to the foil plane and if, as is the case with present 100 kV transmission electron microscopes, the objective lens is not perfect, then terminating fringes and fringe bending seen in the image cannot be related in a simple way to lattice plane geometry in the specimen (1).The purpose of the present work was to devise an experimental test which could be used to confirm, or not, the existence of a one-to-one correspondence between lattice image and specimen structure over the desired range of specimen spacings. Through a study of computed images the following test emerged.

High-resolution electron microscopy of the atomic structure of some grain boundaries in Au

1986 ◽  
Vol 44 ◽  
pp. 414-415
Author(s):  
W. Krakow ◽  
D. A. Smith
Keyword(s):  
Atomic Structure ◽  
High Resolution Electron Microscopy ◽  
Image Features ◽  
Image Feature ◽  
Resolution Electron ◽  
Tilt Boundaries ◽  
Processing Techniques ◽  
Atom Position ◽  
Structure Configuration

The successful determination of the atomic structure of [110] tilt boundaries in Au stems from the investigation of microscope performance at intermediate accelerating voltages (200 and 400kV) as well as a detailed understanding of how grain boundary image features depend on dynamical diffraction processes variation with specimen and beam orientations. This success is also facilitated by improving image quality by digital image processing techniques to the point where a structure image is obtained and each atom position is represented by a resolved image feature. Figure 1 shows an example of a low angle (∼10°) Σ = 129/[110] tilt boundary in a ∼250Å Au film, taken under tilted beam brightfield imaging conditions, to illustrate the steps necessary to obtain the atomic structure configuration from the image. The original image of Fig. 1a shows the regular arrangement of strain-field images associated with the cores of ½ [10] primary dislocations which are separated by ∼15Å.

Imaging of polymer single crystals in low-voltage, high-resolution scanning electron microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 1106-1107
Author(s):  
W.W. Adams ◽  
G. Price ◽  
A. Krause
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Single Crystals ◽  
Low Voltage ◽  
Polymer Surface ◽  
Beam Current ◽  
Image Features ◽  
First Results ◽  
Scanning Electron

It has been shown that there are numerous advantages in imaging both coated and uncoated polymers in scanning electron microscopy (SEM) at low voltages (LV) from 0.5 to 2.0 keV compared to imaging at conventional voltages of 10 to 20 keV. The disadvantages of LVSEM of degraded resolution and decreased beam current have been overcome with the new generation of field emission gun SEMs. In imaging metal coated polymers in LVSEM beam damage is reduced, contrast is improved, and charging from irregularly shaped features (which may be unevenly coated) is reduced or eliminated. Imaging uncoated polymers in LVSEM allows direct observation of the surface with little or no charging and with no alterations of surface features from the metal coating process required for higher voltage imaging. This is particularly important for high resolution (HR) studies of polymers where it is desired to image features 1 to 10 nm in size. Metal sputter coating techniques produce a 10 - 20 nm film that has its own texture which can obscure topographical features of the original polymer surface. In examining thin, uncoated insulating samples on a conducting substrate at low voltages the effect of sample-beam interactions on image formation and resolution will differ significantly from the effect at higher accelerating voltages. We discuss here sample-beam interactions in single crystals on conducting substrates at low voltages and also present the first results on HRSEM of single crystal morphologies which show some of these effects.

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