An automated wide-view imaging system of pathological tissue under optical microscopy

2017 ◽  
Author(s):  
Shangbin Han ◽  
Jimin Yang ◽  
Honglin Wan ◽  
Juan Yang
Keyword(s):  
Optical Microscopy ◽  
Imaging System

scholarly journals Optical microscopy approaches angstrom precision, in 3D!

2019 ◽  
Vol 8 (1) ◽  
Author(s):  
Shi-Wei Chu
Keyword(s):  
Optical Microscopy ◽  
Fluorescence Lifetime ◽  
Graphene Layer ◽  
Imaging System ◽  
Dye Molecules ◽  
Axial Dimension

AbstractBy coupling dye molecules with a graphene layer and localizing the molecules through quantification of fluorescence lifetime quenching, a novel imaging system offers unprecedented 1-nm resolution with angstrom precision in the axial dimension.

A Kind of Non-Contact Measurement System for Areal Surface Texture

2011 ◽  
Vol 189-193 ◽  
pp. 1263-1270 ◽  
Author(s):  
Sheng Huai Wang ◽  
Yu Rong Chen ◽  
Tie Bang Xie
Keyword(s):  
Optical Microscopy ◽  
Measurement System ◽  
Surface Texture ◽  
Imaging System ◽  
Microscopy Imaging ◽  
Contact Measurement ◽  
Displacement System ◽  
Hardware Circuit ◽  
3D Surface Texture ◽  
Areal Surface

For the measurement of areal surface texture, a non-contact measurement method for areal surface texture based on the co-integration of optical microscopy image measurement and white light microscopy interference measurement is proposed, which measures not only 2D size of length but also 3D surface texture. Based on this method, a 2D&3D optical microscopy measurement system for areal surface texture has been developed. It consists of compound optical microscopy imaging system, 3D precision displacement system, hardware circuit, and corresponding software. The practicality and effectiveness of the proposed method of measurement have been verified by the measurement results.

Dislocations, Ordering and Antiferromagnetic Domains in MnO

1970 ◽  
Vol 28 ◽  
pp. 522-523
Author(s):  
D. J. Barber ◽  
R. G. Evans
Keyword(s):  
Electron Diffraction ◽  
Single Crystal ◽  
Optical Microscopy ◽  
Defect Chemistry ◽  
Magnetic Structures ◽  
Optically Transparent ◽  
Magnetic Features ◽  
Antiferromagnetic Domains

Manganese (II) oxide, MnO, in common with CoO, NiO and FeO, possesses the NaCl structure and shows antiferromagnetism below its Neel point, Tn∼ 122 K. However, the defect chemistry of the four oxides is different and the magnetic structures are not identical. The non-stoichiometry in MnO2 small (∼2%) and below the Tn the spins lie in (111) planes. Previous work reported observations of magnetic features in CoO and NiO. The aim of our work was to find explanations for certain resonance results on antiferromagnetic MnO.Foils of single crystal MnO were prepared from shaped discs by dissolution in a mixture of HCl and HNO3. Optical microscopy revealed that the etch-pitted foils contained cruciform-shaped precipitates, often thick and proud of the surface but red-colored when optically transparent (MnO is green). Electron diffraction and probe microanalysis indicated that the precipitates were Mn2O3, in contrast with recent findings of Co3O4 in CoO.

New Aspects in the Design of Electron Optical Magnification Systems

1972 ◽  
Vol 30 ◽  
pp. 606-607
Author(s):  
Willem H.J. Andersen
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Chromatic Aberration ◽  
Research Tool ◽  
Energy Losses ◽  
Objective Lens ◽  
Theoretical Limit ◽  
Optical Magnification ◽  
Chromatic Aberrations ◽  
High Degree

Electron microscope design, and particularly the design of the imaging system, has reached a high degree of perfection. Present objective lenses perform up to their theoretical limit, while the whole imaging system, consisting of three or four lenses, provides very wide ranges of magnification and diffraction camera length with virtually no distortion of the image. Evolution of the electron microscope in to a routine research tool in which objects of steadily increasing thickness are investigated, has made it necessary for the designer to pay special attention to the chromatic aberrations of the magnification system (as distinct from the chromatic aberration of the objective lens). These chromatic aberrations cause edge un-sharpness of the image due to electrons which have suffered energy losses in the object.There exist two kinds of chromatic aberration of the magnification system; the chromatic change of magnification, characterized by the coefficient Cm, and the chromatic change of rotation given by Cp.

A method to measure pores and fissures in geologic materials under S.E.M. by digital image processing

1978 ◽  
Vol 36 (1) ◽  
pp. 212-213
Author(s):  
L. Montoto ◽  
M. Montoto ◽  
A. Bel-Lan
Keyword(s):  
Image Processing ◽  
Optical Microscopy ◽  
Digital Image Processing ◽  
Digital Image ◽  
Digital Processing ◽  
Free Surfaces ◽  
Geologic Materials ◽  
Automatic Information ◽  
Detector Output ◽  
Rock Specimens

INTRODUCTION.- The physical properties of rock masses are greatly influenced by their internal discontinuities, like pores and fissures. So, these need to be measured as a basis for interpretation. To avoid the basic difficulties of measurement under optical microscopy and analogic image systems, the authors use S.E.M. and multiband digital image processing. In S.E.M., analog signal processing has been used to further image enhancement (1), but automatic information extraction can be achieved by simple digital processing of S.E.M. images (2). The use of multiband image would overcome difficulties such as artifacts introduced by the relative positions of sample and detector or the typicals encountered in optical microscopy.DIGITAL IMAGE PROCESSING.- The studied rock specimens were in the form of flat deformation-free surfaces observed under a Phillips SEM model 500. The SEM detector output signal was recorded in picture form in b&w negatives and digitized using a Perkin Elmer 1010 MP flat microdensitometer.

Some Quantification Problems in Parallel EELS Images

1990 ◽  
Vol 48 (2) ◽  
pp. 36-37
Author(s):  
G. Botton ◽  
G. L’Espérance ◽  
M.D. Ball ◽  
C.E. Gallerneault
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Signal To Noise Ratio ◽  
Scanning Transmission Electron Microscope ◽  
Acquisition Time ◽  
Thickness Variation ◽  
Transmission Electron ◽  
Distribution Of Elements ◽  
Scanning Transmission ◽  
Present Distribution

The recently developed parallel electron energy loss spectrometers (PEELS) have led to a significant reduction in spectrum acquisition time making EELS more useful in many applications in material science. Dwell times as short as 50 msec per spectrum with a PEELS coupled to a scanning transmission electron microscope (STEM), can make quantitative EEL images accessible. These images would present distribution of elements with the high spatial resolution inherent to EELS. The aim of this paper is to briefly investigate the effect of acquisition time per pixel on the signal to noise ratio (SNR), the effect of thickness variation and crystallography and finally the energy stability of spectra when acquired in the scanning mode during long periods of time.The configuration of the imaging system is the following: a Gatan PEELS is coupled to a CM30 (TEM/STEM) electron microscope, the control of the spectrometer and microscope is performed through a LINK AN10-85S MCA which is interfaced to a IBM RT 125 (running under AIX) via a DR11W line.

Digital imaging: When should one take the plunge?

1996 ◽  
Vol 54 ◽  
pp. 602-603
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
New Instrument ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.

Multi-mode light microscopy of microtubule assembly dynamics and chromosome movement in vivo and In vitro

1996 ◽  
Vol 54 ◽  
pp. 730-731
Author(s):  
E. D. Salmon ◽  
J. C. Waters ◽  
C. Waterman-Storer
Keyword(s):  
Imaging System ◽  
Ccd Camera ◽  
Transmitted Light ◽  
Microtubule Assembly ◽  
Live Cells ◽  
Optical Efficiency ◽  
Multiple Band ◽  
Multi Mode

We have developed a multi-mode digital imaging system which acquires images with a cooled CCD camera (Figure 1). A multiple band pass dichromatic mirror and robotically controlled filter wheels provide wavelength selection for epi-fluorescence. Shutters select illumination either by epi-fluorescence or by transmitted light for phase contrast or DIC. Many of our experiments involve investigations of spindle assembly dynamics and chromosome movements in live cells or unfixed reconstituted preparations in vitro in which photodamage and phototoxicity are major concerns. As a consequence, a major factor in the design was optical efficiency: achieving the highest image quality with the least number of illumination photons. This principle applies to both epi-fluorescence and transmitted light imaging modes. In living cells and extracts, microtubules are visualized using X-rhodamine labeled tubulin. Photoactivation of C2CF-fluorescein labeled tubulin is used to locally mark microtubules in studies of microtubule dynamics and translocation. Chromosomes are labeled with DAPI or Hoechst DNA intercalating dyes.

Correlation of Pore Structure and Permeability by SEM-Image Analysis

1990 ◽  
Vol 48 (1) ◽  
pp. 428-429
Author(s):  
C. A. Callender ◽  
Wm. C. Dawson ◽  
J. J. Funk
Keyword(s):  
Image Analysis ◽  
Pore Structure ◽  
Imaging System ◽  
Pore Space ◽  
Simulation Models ◽  
Image Analyzer ◽  
Imaging Data ◽  
Sem Images ◽  
Thin Sections ◽  
Rock Types

The geometric structure of pore space in some carbonate rocks can be correlated with petrophysical measurements by quantitatively analyzing binaries generated from SEM images. Reservoirs with similar porosities can have markedly different permeabilities. Image analysis identifies which characteristics of a rock are responsible for the permeability differences. Imaging data can explain unusual fluid flow patterns which, in turn, can improve production simulation models.Analytical SchemeOur sample suite consists of 30 Middle East carbonates having porosities ranging from 21 to 28% and permeabilities from 92 to 2153 md. Engineering tests reveal the lack of a consistent (predictable) relationship between porosity and permeability (Fig. 1). Finely polished thin sections were studied petrographically to determine rock texture. The studied thin sections represent four petrographically distinct carbonate rock types ranging from compacted, poorly-sorted, dolomitized, intraclastic grainstones to well-sorted, foraminiferal,ooid, peloidal grainstones. The samples were analyzed for pore structure by a Tracor Northern 5500 IPP 5B/80 image analyzer and a 80386 microprocessor-based imaging system. Between 30 and 50 SEM-generated backscattered electron images (frames) were collected per thin section. Binaries were created from the gray level that represents the pore space. Calculated values were averaged and the data analyzed to determine which geological pore structure characteristics actually affect permeability.

Electron Holography Improving Transmission Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 208-209
Author(s):  
Hannes Lichte
Keyword(s):  
Electron Microscopy ◽  
Transfer Functions ◽  
Imaging System ◽  
Spherical Aberration ◽  
Image Plane ◽  
Chromatic Aberration ◽  
Object Wave ◽  
Objective Lens ◽  
Electron Holography ◽  
Wave Aberration

Generally, the electron object wave o(r) is modulated both in amplitude and phase. In the image plane of an ideal imaging system we would expect to find an image wave b(r) that is modulated in exactly the same way, i. e. b(r) =o(r). If, however, there are aberrations, the image wave instead reads as b(r) =o(r) * FT(WTF) i. e. the convolution of the object wave with the Fourier transform of the wave transfer function WTF . Taking into account chromatic aberration, illumination divergence and the wave aberration of the objective lens, one finds WTF(R) = Echrom(R)Ediv(R).exp(iX(R)) . The envelope functions Echrom(R) and Ediv(R) damp the image wave, whereas the effect of the wave aberration X(R) is to disorder amplitude and phase according to real and imaginary part of exp(iX(R)) , as is schematically sketched in fig. 1.Since in ordinary electron microscopy only the amplitude of the image wave can be recorded by the intensity of the image, the wave aberration has to be chosen such that the object component of interest (phase or amplitude) is directed into the image amplitude. Using an aberration free objective lens, for X=0 one sees the object amplitude, for X= π/2 (“Zernike phase contrast”) the object phase. For a real objective lens, however, the wave aberration is given by X(R) = 2π (.25 Csλ3R4 + 0.5ΔzλR2), Cs meaning the coefficient of spherical aberration and Δz defocusing. Consequently, the transfer functions sin X(R) and cos(X(R)) strongly depend on R such that amplitude and phase of the image wave represent only fragments of the object which, fortunately, supplement each other. However, recording only the amplitude gives rise to the fundamental problems, restricting resolution and interpretability of ordinary electron images:

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