Analysis of Horn Antennas Including the Horn Transition into Half Space Employing a Full Wave Hybrid Technique

2013 ◽  
Author(s):  
R. Jana ◽  
R. Bhattacharjee
Keyword(s):  
Half Space ◽  
Hybrid Technique ◽  
Horn Antennas ◽  
Full Wave

scholarly journals A Hybrid Asymptotic-FVTD Method for the Estimation of the Radar Cross Section of 3D Structures

Electronics ◽  
2019 ◽  
Vol 8 (12) ◽  
pp. 1388 ◽  
Author(s):  
Alessandro Fedeli ◽  
Matteo Pastorino ◽  
Andrea Randazzo
Keyword(s):  
Cross Section ◽  
High Frequency ◽  
Current Method ◽  
Radar Cross Section ◽  
Hybrid Technique ◽  
Electromagnetic Problems ◽  
Large Structures ◽  
Full Wave ◽  
Scattering Effects ◽  
Wave Technique

The Finite Volume Time-Domain (FVTD) method is an effective full-wave technique which allows an accurate computation of the electromagnetic field. In order to analyze the scattering effects due to electrically large structures, it can be combined with methods based on high-frequency approximations. This paper proposes a hybrid technique, which combines the FVTD method with an asymptotic solver based on the physical optics (PO) and the equivalent current method (ECM), allowing the solution of electromagnetic problems in the presence of electrically large structures with small details. Preliminary numerical simulations, aimed at computing the radar cross section of perfect electric conducting (PEC) composite objects, are reported in order to evaluate the effectiveness of the proposed method.

Acoustic microscopy techniques for the inspection of integrated circuit devices and packages

1992 ◽  
Vol 50 (2) ◽  
pp. 966-967
Author(s):  
Thomas M. Moore
Keyword(s):  
Integrated Circuit ◽  
Acoustic Microscopy ◽  
Hybrid Technique ◽  
Frequency Scanning ◽  
Ic Packaging ◽  
Ic Package ◽  
Microscopy Techniques ◽  
Ic Package Inspection ◽  
Pulse Echo ◽  
Scanning Acoustic Microscope

In the last decade, a variety of characterization techniques based on acoustic phenomena have come into widespread use. Characteristics of matter waves such as their ability to penetrate optically opaque solids and produce image contrast based on acoustic impedance differences have made these techniques attractive to semiconductor and integrated circuit (IC) packaging researchers.These techniques can be divided into two groups. The first group includes techniques primarily applied to IC package inspection which take advantage of the ability of ultrasound to penetrate deeply and nondestructively through optically opaque solids. C-mode Acoustic Microscopy (C-AM) is a recently developed hybrid technique which combines the narrow-band pulse-echo piezotransducers of conventional C-scan recording with the precision scanning and sophisticated signal analysis capabilities normally associated with the high frequency Scanning Acoustic Microscope (SAM). A single piezotransducer is scanned over the sample and both transmits acoustic pulses into the sample and receives acoustic echo signals from the sample.

On a technique for deriving explicit transfer matrices of orthotropic layers

2015 ◽  
Vol 37 (4) ◽  
pp. 303-315 ◽  
Author(s):  
Pham Chi Vinh ◽  
Nguyen Thi Khanh Linh ◽  
Vu Thi Ngoc Anh
Keyword(s):  
Wave Propagation ◽  
Explicit Form ◽  
Half Space ◽  
Transfer Matrix ◽  
Rayleigh Waves ◽  
Secular Equation ◽  
Transfer Matrices ◽  
Orthotropic Layer ◽  
Wave Propagation Problem ◽  
Arbitrary Thickness

This paper presents  a technique by which the transfer matrix in explicit form of an orthotropic layer can be easily obtained. This transfer matrix is applicable for both the wave propagation problem and the reflection/transmission problem. The obtained transfer matrix is then employed to derive the explicit secular equation of Rayleigh waves propagating in an orthotropic half-space coated by an orthotropic layer of arbitrary thickness.

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