Reliable SRAM using NAND‐NOR Gate in beyond‐CMOS QCA technology
Keyword(s):
Keyword(s):
Charge-Resistance Approach to Benchmarking Performance of Beyond-CMOS Information Processing Devices
2014 ◽
Vol 13
(1)
◽
pp. 143-150
◽
2009 ◽
Vol 30
(1)
◽
pp. 30-32
◽