Role of depth resolution in quantitative glow discharge optical emission spectrometry depth analysis

Alfred Quentmeier

doi:10.1039/ja9940900355

Role of depth resolution in quantitative glow discharge optical emission spectrometry depth analysis

Journal of Analytical Atomic Spectrometry ◽

10.1039/ja9940900355 ◽

1994 ◽

Vol 9 (3) ◽

pp. 355 ◽

Cited By ~ 14

Author(s):

Alfred Quentmeier

Keyword(s):

Glow Discharge ◽

Optical Emission ◽

Depth Resolution ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Analysis

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Preliminary study of the role of discharge conditions on the in-depth analysis of conducting thin films by radiofrequency glow discharge optical emission spectrometry

Journal of Analytical Atomic Spectrometry ◽

10.1039/ja9951000671 ◽

1995 ◽

Vol 10 (9) ◽

pp. 671-676 ◽

Cited By ~ 8

Author(s):

Nerea Bordel-García ◽

Rosario Pereiro-García ◽

Matilde Fernández-García ◽

Alfredo Sanz-Medel ◽

Tina R. Harville ◽

...

Keyword(s):

Thin Films ◽

Glow Discharge ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Analysis ◽

Preliminary Study ◽

Radiofrequency Glow Discharge

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Comparison of depth resolution for direct current and radiofrequency modes in glow discharge optical emission spectrometry

Journal of Analytical Atomic Spectrometry ◽

10.1039/ja9951000677 ◽

1995 ◽

Vol 10 (9) ◽

pp. 677-680 ◽

Cited By ~ 31

Author(s):

Frank Präßler ◽

Volker Hoffmann ◽

Joachim Schumann ◽

Klaus Wetzig

Keyword(s):

Glow Discharge ◽

Direct Current ◽

Optical Emission ◽

Depth Resolution ◽

Optical Emission Spectrometry ◽

Emission Spectrometry

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Glow discharge optical emission spectrometry (GDOES) depth profiling analysis of anodic alumina films—a depth resolution study

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199901)27:1<24::aid-sia457>3.0.co;2-n ◽

1999 ◽

Vol 27 (1) ◽

pp. 24-28 ◽

Cited By ~ 39

Author(s):

K. Shimizu ◽

G. M. Brown ◽

H. Habazaki ◽

K. Kobayashi ◽

P. Skeldon ◽

...

Keyword(s):

Glow Discharge ◽

Depth Profiling ◽

Optical Emission ◽

Depth Resolution ◽

Anodic Alumina ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Alumina Films ◽

Profiling Analysis ◽

Resolution Study

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Evaluation of in-depth resolution in grimm-type glow discharge optical emission spectrometry from differentiated depth profiles

Surface and Interface Analysis ◽

10.1002/sia.740230404 ◽

1995 ◽

Vol 23 (4) ◽

pp. 213-218 ◽

Cited By ~ 9

Author(s):

Takahiro Hamada ◽

Kazuaki Wagatsuma ◽

Kichinosuke Hirokawa

Keyword(s):

Glow Discharge ◽

Optical Emission ◽

Depth Resolution ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Profiles

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Improvement of the Information Depth in In-depth Analysis by Radio-frequency-powered Glow Discharge Optical Emission Spectrometry

ISIJ International ◽

10.2355/isijinternational.42.suppl_s87 ◽

2002 ◽

Vol 42 (Suppl) ◽

pp. S87-S92

Author(s):

Kazuaki Wagatsuma

Keyword(s):

Glow Discharge ◽

Radio Frequency ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Information Depth ◽

Depth Analysis

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Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use

10.3403/02144326u ◽

2015 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Surface Chemical Analysis

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Low alloyed steel. Determination of C, Si, Mn, P, S, Cr, Ni, Al, Ti and Cu. Glow discharge optical emission spectrometry (routine method)

10.3403/30196841u ◽

2015 ◽

Keyword(s):

Glow Discharge ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Alloyed Steel ◽

Emission Spectrometry ◽

Routine Method ◽

Low Alloyed Steel

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Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry

10.3403/30203801 ◽

2011 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Metal Oxide ◽

Oxide Films ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Metal Oxide Films ◽

Surface Chemical Analysis

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Multi-matrix analysis by glow discharge optical emission spectrometry on spectrometers with solid-state detectors

Journal of Analytical Atomic Spectrometry ◽

10.1039/b300838j ◽

2003 ◽

Vol 18 (6) ◽

pp. 584 ◽

Cited By ~ 9

Author(s):

Zden?k Weiss

Keyword(s):

Solid State ◽

Glow Discharge ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Matrix Analysis ◽

Emission Spectrometry ◽

Solid State Detectors

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Correcting for background and inter-element effects in glow discharge optical emission spectrometry

Journal of Analytical Atomic Spectrometry ◽

10.1039/ja9940900363 ◽

1994 ◽

Vol 9 (3) ◽

pp. 363 ◽

Cited By ~ 7

Author(s):

Richard Payling ◽

Nicole V. Brown ◽

Stephen A. Gower

Keyword(s):

Glow Discharge ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry

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